September 5, 2024, 10:30 a.m. to 6:30 p.m. IST
Sheraton Grand Bangalore Hotel at Brigade Gateway, Bengaluru, India
Seminar Agenda:
- Introduction to semiconductor failure analysis (FA)
- Circuit editing and semiconductor prototyping
- Semiconductor defect localization techniques for advanced packaging and power devices
- Scanning electron microscopy (SEM) analysis and metrology use cases
- Semiconductor applications for DualBeam (FIB-SEM) instruments
- Packaged die characterization: precise, high-quality, physical analysis
- Introduction to connected FA workflows to maximize productivity
- 3D visualization of semiconductor structures
- ESD compliance testing (including live demo of Thermo Scientific MK2 Test System)
Attend this seminar to learn about the global industry benchmark analytical solutions for logic, memory, power, and packaged devices. You will also have the opportunity to talk to our product technical experts and network with industry colleagues.