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Get big insights about small defects
Scientists and researchers continuously face challenges with material defects and contaminants which can compromise product quality. Thorough inspection and testing is crucial to prevent defects and maintain high-quality standards. With single point microscopy, small surface defects can be investigated on almost any material including pharmaceutical products, polymers, and semiconductor devices, among many others.
In this on-demand webinar, you’ll learn how to use Raman microscopy on the Thermo Scientific™ DXR3 Raman Microscope to investigate material defects and contaminants.
Who should watch?
· Researchers and scientists interested in identifying small-scale contaminants.
· Researchers and scientists in pharmaceutical, semiconductor, and polymer/packaging industries.
· Researchers in failure analysis roles.
· Scientists in QA/QC roles.
About the Speaker
Dr. Matt Gabel is a Raman Application Scientist at Thermo Fisher Scientific. He graduated from Washington State University with a Ph.D. in physics, studying the ferroelectric properties of semiconductors. He became deeply involved in vibrational spectroscopy while working as a visiting researcher at Pacific Northwest National Laboratory studying semiconductors with tip-enhanced Raman spectroscopy.
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