Search Thermo Fisher Scientific
d1db - Nanoport menu
Available Techniques/Events/Available Instruments/Request training
Electron microscopy facility in Hillsboro, Oregon, United States
Investing in new instrumentation or capital equipment is never easy, and you want to make sure you’re getting the perfect solution that meets your needs and expectations. While documentation such as whitepapers and datasheets can give you some insight into the capability of our instruments, dedicated software, and professional services, it is unlikely to perfectly align with your unique challenges, samples, and use cases. That’s why we believe that the best way for you to gauge if a solution is right for you is by personally experiencing it.
The Thermo Scientific Americas NanoPort electron microscopy facility (located in Hillsboro, Oregon) is an electron microscopy (EM) demonstration and training facility where you can develop and advance your skills with trusted solutions and support, both from our experts as well as from your peers. In the NanoPort facility, we offer dedicated workflow support through workshops, demos, and training for researchers and engineers in the life sciences, materials science, and semiconductor fields.
Americas NanoPort
5350 NE Dawson Creek Drive
Hillsboro, Oregon 97124 USA
Phone: +1 (503) 726-7500
Electron microscopy techniques
The Americas NanoPort has over 40 professionals with many years of hands-on experience at customer sites and most of them hold a PhD or MSc in their area of expertise.
We invite you to bring your own sample to the Americas NanoPort to personally experience the difference our instrumentation, software, and knowledge can make for your challenging analysis and characterization needs.
See the Thermo Fisher Scientific difference – the expertise and analytical techniques available at the Americas NanoPort include:
For materials science
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- DualBeam microscopy (combined focused ion beam and SEM (FIB-SEM) tools)
- X-ray photoelectron spectroscopy (XPS)
For semiconductors
Events at the Americas NanoPort electron microscopy facility in Hillsboro, Oregon
Workshops: A combination of discussion and practical work focusing on a particular subject/industry, where we encourage attendees to share their knowledge and experience.
In-house courses: Hands-on in-person training that helps customers build their electron microscopy application skillset.
Remote training: Tailored training delivered remotely straight from our NanoPort’s top experts to you, whether you are in your lab or at any remote location.
Please contact us to learn more about the cost of these events and how to schedule them.
Electron microscopes and analytical instruments available at the Hillsboro electron microscopy facility
DualBeam instruments
Thermo Scientific Helios Hydra UX DualBeam (Plasma FIB) Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation. For Materials Science, Semiconductor
Thermo Scientific Hydra Bio Plasma-FIB DualBeam Plasma focused ion beam scanning electron microscope versatile for volume electron microscopy and cellular cryo-tomography lamella preparation. For Life Sciences
Thermo Scientific Helios 5 PFIB Laser DualBeam Combined plasma focused ion beam milling with femtosecond laser ablation and SEM (scanning electron microscopy) imaging. For Materials Science, Semiconductor
Thermo Scientific Helios 5 UX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductor, Life Sciences
Thermo Scientific Helios 5 FX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Semiconductor, Materials Science
Thermo Scientific Helios 5 EXL DualBeam FIB-SEM TEM sample preparation for the semiconductor industry, enabling full-wafer analysis. For Semiconductor
Thermo Scientific Helios 5 PXL DualBeam PFIB SEM for in-line metrology and process monitoring of advanced 3D NAND and DRAM devices. For Semiconductor
Thermo Scientific Scios 2 DualBeam Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization. For Materials Science, Semiconductor, Life Sciences
Thermo Scientific Aquilos 2 DualBeam Cryo-EM sample preparation tool with extended run time and enhanced automation. For Life Sciences
Transmission electron microscopes
Thermo Scientific Spectra Ultra S/TEM High resolution TEM and STEM microscope for all materials science and semiconductor applications. For Materials Science, Semiconductor
Thermo Scientific Talos F200X G2 S/TEM TEM microscope for high resolution TEM and STEM with accurate chemical quantification. For Materials Science, Semiconductor
Thermo Scientific Talos L120C TEM TEM microscope for sample screening and high contrast TEM and STEM imaging of beam sensitive materials. For Materials Science, Life Sciences
Thermo Scientific Glacios 2 Cryo-TEM A complete solution for high-resolution structure determination of a large range of biological targets. For Life Sciences
Thermo Scientific Tundra Cryo-TEM A dedicated structural analysis solution designed to bring cryo-electron microscopy (cryo-EM) to your laboratory at an affordable price point. For Life Sciences
Scanning Electron Microscopes
Thermo Scientific Axia ChemiSEM SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. For Materials Science
Thermo Scientific Apreo 2 SEM Scanning electron microscope for versatile, high-performance materials imaging and analysis. For Semiconductor, Materials Science, Life Sciences
Thermo Scientific Volumescope 2 SEM 3D SEM for large volume samples with serial block face imaging and multi energy deconvolution. For Life Sciences
Thermo Scientific Quattro ESEM (available with Thermo Scientific ChemiSEM Technology) Environmental scanning electron microscope (ESEM) for the study of materials in their natural state. For Life Sciences, Materials Science
Thermo Scientific Verios 5 HP SEM Scanning electron microscopy characterization of nanomaterials with sub-nanometer resolution and high material contrast. For Semiconductor, Materials Science, Life Sciences
Thermo Scientific Phenom XL G2 Desktop SEM Desktop SEM with increased chamber size for large samples up to 100 mm x 100 mm for industrial research and failure analysis. For Materials Science
X-ray Photoelectron Spectrometers
Thermo Scientific Nexsa G2 Surface Analysis System X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities For Materials Science, Semiconductor
Broad Ion Beam Polisher
Thermo Scientific CleanMill Broad Ion Beam System A complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials. For Materials Science, Semiconductor
Sample Vitrification System
Thermo Scientific Vitrobot MK IV System Reproducible vitrification of biological samples. For Life Sciences
Electron microscope remote training
On-site training for new instrumentation can be time-consuming, and the training needs of each facility and lab can vary greatly. To address these difficulties, we have developed a new Remote Application Training program to bring our best application scientists and training material to you, no matter where you are in the world.
Request a demo or training
Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards