Search Thermo Fisher Scientific
693f - Key/Specs/Resources/Samples/Tech/Doc/Contact
X-ray photoelectron spectroscopy
The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.
High-performance X-ray source
A new, low-power X-ray monochromator allows selection of the analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
Sample viewing
Bring sample features into focus with the Nexsa XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly using a fully focused XPS image.
Insulator analysis
The patented dual-beam flood source couples low-energy ion beams with very low-energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need for charge referencing, making the analysis of the data from insulating samples easy and reliable.
Depth profiling
Go beyond the surface with a standard ion source or MAGCIS, the optional dual-mode monatomic and gas cluster ion source; automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Optional sample holders
Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.
Digital Control
Instrument control, data processing, and reporting are all controlled from the Windows Software-based Avantage data system.
NX sample heater module
Fully software-controlled sample heating option, enabling temperature-dependent studies.
Animation: Thermo Scientific Nexsa surface analysis system
Style Sheet for Products Table Specifications
| Analyzer type |
|
| X-ray source type |
|
| X-ray spot size |
|
| Depth profiling |
|
| Maximum Sample area |
|
| Maximum sample thickness |
|
| Vacuum system |
|
| Optional accessories |
|
Style Sheet for Komodo Tabs
Surface Analysis Learning Center
The chemistry of the surface of a material, or at the interfaces of layers, determines how a material behaves. Our surface analysis references and resources can help you engineer desired properties or better understand materials when they do not perform as expected.
X-ray photoelectron spectroscopy of atomic elements
A key feature of the Thermo Scientific Avantage Data System for XPS is an extensive knowledge base of information regarding XPS analysis and the elements they characterize.
Watch on-demand: Thermo Scientific Nexsa G2 Surface Analysis System Demo
You will learn how the Nexsa G2 XPS System can be used to investigate a wide range of materials using XPS, supported by the additional analysis techniques on the system: UV photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), Raman spectroscopy, and more.
Watch on-demand: Thermo Scientific Nexsa G2 Surface Analysis System Demo
You will learn how the Nexsa G2 XPS System can be used to investigate a wide range of materials using XPS, supported by the additional analysis techniques on the system: UV photoelectron spectroscopy (UPS), ion scattering spectroscopy (ISS), reflected electron energy loss spectroscopy (REELS), Raman spectroscopy, and more.
Style Sheet to change H3 to p with em-h3-header class
Style Sheet to change Sample H3 to p with em-h3-header class
Battery Research
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Metals Research
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
Polymers Research
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Geological Research
Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.
Oil and Gas
As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.
Nanoparticles
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Forensics
Micro-traces of crime scene evidence can be analyzed and compared using electron microscopy as part of a forensic investigation. Compatible samples include glass and paint fragments, tool marks, drugs, explosives, and GSR (gunshot residue).
Catalysis Research
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
Fibers and Filters
The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features.
2D Materials
Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.
Automotive Materials Testing
Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.
Multi-technique surface analysis workflow
To meet the need for extensive characterization of surfaces, we have established multi-technique workflows based on using either the Thermo Scientific ESCALAB CXi XPS Microprobe or the Thermo Scientific Nexsa Surface Analysis System. These instruments are designed as multi-technique workstations to provide comprehensive analyses in a timely and efficient manner.
X-Ray Photoelectron Spectroscopy
X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.
Multi-technique surface analysis workflow
To meet the need for extensive characterization of surfaces, we have established multi-technique workflows based on using either the Thermo Scientific ESCALAB CXi XPS Microprobe or the Thermo Scientific Nexsa Surface Analysis System. These instruments are designed as multi-technique workstations to provide comprehensive analyses in a timely and efficient manner.
X-Ray Photoelectron Spectroscopy
X-ray photoelectron spectroscopy (XPS) enables surface analysis, providing elemental composition as well as the chemical and electronic state of the top 10 nm of a material. With depth profiling, XPS analysis extends to compositional insight of layers.
Style Sheet to change H2 style to p with em-h2-header class
Style Sheet to change H2 style to p with em-h2-header class
Style Sheet for Support and Service footer
Style Sheet for Fonts
Style Sheet for Cards