Search Thermo Fisher Scientific
- Order Status
- Quick Order
-
Don't have an account ? Create Account
Search Thermo Fisher Scientific
The Thermo Scientific iFast Developer's Tool Kit combines the flexibility of scripting with the ease of use of graphical programming to make recipe creation faster and easier than ever before.
The iFast Developer's Tool Kit enables operators to quickly and easily create new or modify existing recipes to fit their specific needs. Recipes are edited within a new intuitive graphical environment, enabling faster learning of the programming environment as well as an easier understanding of existing recipes. Within the iFast Developer's environment, the operator is able to control column settings, detector settings, stage motion and position, patterning and site alignments with logical operation and looping. This enables a high degree of customization to match specific application requirements.
iFast Recorder is included with iFast Developer's Tool Kit allowing to record recipes interactively on an instrument both for unattended operation as well as the creation of a baseline recipe for further enhancements with the Developer's Tool Kit.
Innovation starts with research and development. Learn more about solutions to help you understand innovative structures and materials at the atomic level.
Manufacturing today’s complex semiconductors requires exact process controls. Learn more about advanced metrology and analysis solutions to accelerate yield learnings.
Complex semiconductor device structures result in more places for defects to hide. Learn more about failure analysis solutions to isolate, analyze, and repair defects.
Many factors impact yield, performance, and reliability. Learn more about solutions to characterize physical, structural, and chemical properties.
Semiconductor Analysis and Imaging
Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.
Semiconductor Analysis and Imaging
Thermo Fisher Scientific offers scanning electron microscopes for every function of a semiconductor lab, from general imaging tasks to advanced failure analysis techniques requiring precise voltage-contrast measurements.
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.