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The Thermo Scientific Phenom ParticleX Desktop SEM (Scanning Electron Microscope) is a multi-purpose desktop SEM designed for multiple applications at the microscale:
A versatile solution for high-quality, in-house analysis, the Phenom ParticleX Desktop SEM gives you the ability to carry out speedy characterization, verification, and classification of materials, supporting your production with fast, accurate, and trusted data. The system is simple to operate and fast to learn, opening up particle, material, and failure analysis to a wider group of users.
In each webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges.
Topic | Title | Speaker | Run time |
Webinar 1 | How to certify your NCM powder quality with SEM+EDS | Luigi Raspolini | 46 minutes |
Webinar 2 | Electron-microscope-grade cleanliness in electronics | Luigi Raspolini | 33 minutes |
Webinar 3 | Speed up your automated gunshot residue analysis | Rogier Miltenburg | 48 minutes |
Webinar 4 | Technical cleanliness analysis with an SEM: Why? | Luigi Raspolini | 51 minutes |
Webinar 5 | Understand your steel with automated inclusion analysis | Rogier Miltenburg | 38 minutes |
Webinar 6 | One tool for complete AM powder characterization | Luigi Raspolini | 36 minutes |
See the abstracts for individual sessions below.
NCM powders represent about 40% of the cost of batteries raw materials, largely due to the price of cobalt. The demand for proof that such expensive powders are responding to purity criteria is growing, especially because of the fire hazard represented by conductive particles.
In this on-demand webinar we will see what kind of automated characterization is possible with an electron microscope and how these information can be used. After watching this presentation, one will learn:
The complexity of PCB has reached levels where even working in high grade cleanrooms might not be sufficient to guarantee a high-quality product. Lose microparticulate can have several sources and irreversibly compromise the quality of the manufactured products. An electron microscope can tell you where they come from and in this on-demand webinar we will see how!
After watching this presentation, one will learn:
The way GSR analysis is performed is changing. Where analysts would use a room-filling SEM in the past, many now chose a desktop SEM for ease of use and high performance. Watch this demo on Phenom GSR to learn about this leading technology.
After watching this presentation, one will:
Technical cleanliness analysis on incoming supplies has become a rigid requirement from most OEM. Watch this seminar to learn how knowing the composition of the contaminants in your production environment can help you comply with the norms while improving your productivity.
After watching this presentation, one will learn:
Inclusion analysis by SEM/EDX is on its way to become the new standard. Where metallurgists would use a room-filling SEM in the past, many now chose a desktop SEM for ease of use and high performance. Watch this demo on the ParticleX Steel to learn about this leading technology.
After watching this presentation, one will:
Characterizing a powder for additive manufacturing, be it for the incoming quality acceptance test or for recycling purposes, is a difficult multi-step process. Information about the powder granulometry and chemical composition are critical to the print quality and an electron microscope can provide you both at the same time!
After watching this presentation, one will learn:
Speaker: Luigi Raspolini
Luigi has worked with some of the largest manufacturers of Lithium batteries and NCM powders in order to have a clear and complete view of the manufacturing challenges. He learned that industrial manufacturing must comply with standards, but it still is in many aspects an artisanal process and every production facility requires refinements to their SOP. He will always help you develop yours with efficiency and a smile!
Speaker: Rogier Miltenburg
Rogier is our desktop SEM applications and product specialist for metal applications. His goal is to enable metallurgists to quickly provide accurate results on the quality of their steel by continuously improving our automated analysis.