SEM EDX Analysis of Inclusions in Steel Using ParticleX Desktop SEM Webinar

Duration: 53 min

In the steel industry, scanning electron microscopes have many applications, including quality control, failure analysis, and process control. The Phenom ParticleX Steel Desktop SEM is a multi-purpose tool that can be used for both regular SEM work and high-speed automated inclusion analysis—two analyses that frequently run for several hours and prevent other SEM uses.

In this webinar we will discuss how you can collect results from multiple steel samples in a defined recipe, scan each sample frame-by-frame, measure particle morphology at high magnification, and examine each particle for classification via EDS. Furthermore, we will cover how to generate custom reports with the information you need and meet several international reporting standards.

Learning goals:

• Understand how to automatically collect inclusion data on a desktop SEM
• Discuss the importance of a high-brightness electron source designed for long life and stability
• Make a strong case in your company for a desktop SEM with automation dedicated for your application