On demand webinar: Discover the all new Helios 5 Laser PFIB for fast access to deep sub-surface analysis and sample extraction

The new Thermo Scientific Helios 5 Laser PFIB builds on the industry-leading Helios DualBeam family and incorporates the novel femto-second laser system for extremely fast material removal.

Register for our recorded webinar and learn how the combination of fs-Laser and PFIB provides mm-scale subsurface and 3D analysis at nm resolution and enables new workflows such as fast characterization of air sensitive samples and multi-scale correlative microscopy with deep subsurface sample extraction. This instrument also offers all the capabilities of proven Helios 5 PFIB platform, including highest quality Ga-free TEM/APT sample preparation and extreme high-resolution imaging.

Who should attend?

• Researchers and engineers working in fields related to materials science, interested in multi-scale correlative microscopy workflows providing mm-scale characterization with nm-resolution

Why should you attend?

• Learn how Helios 5 Laser PFIB enables thousands times faster material removal compared to standard FIB-SEM or PFIB-SEM instruments, and at the same time, produces high quality cut face suitable for SEM imaging, or even EBSD mapping
• See how Helios 5 Laser PFIB allows you to reveal nm-scale faults and failures embedded millimeters deep within your sample, much faster than with any other tool
• Discover how Helios 5 Laser PFIB with advanced automation and unique design enables automated overnight runs and unattended acquisition of mm-scale 3D volumes, freeing up the microscope for other uses during the day such as advanced TEM sample preparation or in situ experimentation.

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