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Materials Science
Particle Analysis Using Electron Microscopy
Particle characterization with scanning electron microscopy for materials analysis applications.
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SEM particle analysis
Thermo Scientific Phenom ParticleX and Perception Desktop SEMs deliver a comprehensive plug-and-play SEM-EDS software solution for particle analysis workflows. Featuring automated characterization, verification, and classification of materials, the instruments support your production with fast, accurate, and reliable data that adheres to industry regulations and standards.
Features include:
- Fully integrated particle analysis software with SEM-EDS system
- Certified repeatability and reproducibility
- Compliance with industry standards in technical cleanliness, steel inclusion analysis, and gunshot residue analysis
- Automated, unattended long analysis run time
- Small system footprint with built-in, customizable reporting software
- Local language support and training
- Continuous updates based on the latest technology and your feedback
Electron microscopy particle analysis applications
Technical cleanliness particle analysis
Perform technical cleanliness at the microscale with the multi-purpose Phenom ParticleX TC Desktop SEM.
Steel manufacturing particle analysis
Automate steel inclusion analysis and quickly respond to faults and failures with the Phenom ParticleX Steel Desktop SEM.
Additive manufacturing particle analysis
Analyze samples up to 100 mm x 100 mm and ensure purity at the microscale with the Phenom ParticleX AM Desktop SEM.
Gunshot residue particle analysis
Speed up gunshot residue analysis with the automated, long-lasting Phenom Perception GSR Desktop SEM.
Battery manufacturing materials particle analysis
Effectively trace contaminants in battery materials with the Phenom ParticleX Battery Desktop SEM.
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
SEM image of two particles of cobalt isolated from a powder sample.
Glass particles dispersed on a substrate and imaged at low magnification using SEM.
Grouping of particles from a powder sample, imaged using SEM.
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Documents
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
SEM image of a cobalt particle aggregate. Such SEM images can be analyzed and parametrized with a range of Thermo Fisher Scientific software workflows.
SEM image of two particles of cobalt isolated from a powder sample.
Glass particles dispersed on a substrate and imaged at low magnification using SEM.
Grouping of particles from a powder sample, imaged using SEM.
Automated, large-area STEM-EDS data reveals the elemental composition of individual nanoparticles. Data processing performed with Avizo Software. Sample courtesy of J. Bursik, Institute of Physics of Materials, Brno
Through a combination of Maps, Velox and Avizo Software the Talos TEM can automatically produce and analyze large-area TEM data such as this collection of nanoparticles. Here, color corresponds to particle size; this data can subsequently be quantified and analyzed. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
Documents
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Technical Cleanliness
More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Battery Research
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Automotive Materials Testing
Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.
Metals Research
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
2D Materials
Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.
Polymers Research
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Nanoparticles
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Catalysis Research
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
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Electron microscopy services for
the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
