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On-Demand webinar
Duration: 44 minutes
Semiconductor technology innovation continues to create more challenges for FA engineers. This is especially true for advanced packaged die analysis and high-performance power device analysis. Both application spaces are critically reliant on the adoption of new, more complex materials and structures, which require a novel approach to FA sample preparation and imaging.
Watch our webinar to learn how the Thermo Scientific Helios Hydra PFIB DualBeam’s selectable-species FIB enables highly efficient sample preparation across a wide variety of materials and length scales, from precise TEM sample preparation to the creation of large-volume, high-quality SEM data sets.
The Helios Hydra PFIB DualBeam is engineered to solve the most difficult FA roadmap challenges.
Don't miss this opportunity to learn from industry experts and discover how the Helios Hydra PFIB DualBeam can enhance your failure analysis processes.
About the speaker
Dr. Adam Stokes, Product Marketing Manager
Adam Stokes is a product marketing manager of plasma focused ion beam (PFIB) and laser products for semiconductor-based applications at Thermo Fisher Scientific. Before his current role, Adam specialized in plasma FIB applications for materials science with Thermo Fisher. Prior to Thermo Fisher, Adam worked at the National Renewable Energy Laboratory for 6 years specializing in electron microscopy and photovoltaics device physics. Adam received his PhD in Materials Science from the Colorado School of Mines in 2016. His areas of expertise include plasma source and liquid metal ion source FIB, (scanning) transmission electron microscopy, and atom probe tomography.
Please register for the webinar below.