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The new Thermo Scientific Iliad 300 (S)TEM is our high-resolution, aberration-corrected scanning transmission electron microscope for a broad range of materials science applications.
The fully integrated Iliad 300 Scanning Transmission Electron Microscope features the new Iliad EELS Spectrometer and Energy Filter, the NanoPulser (our new electrostatic beam blanker), your choice of a Dual-X or Super-X EDX Detector Systems, and accelerating voltage from 30 to 300kV. Thermo Scientific Velox Software facilitates access to all the microscope modalities, while Thermo Scientific AutoScript Software delivers advanced control of the platform. The Iliad 300 (S)TEM’s unprecedented hardware and software integration, plus the flexibility to choose detectors, holders, and other components, helps to enable precise analytical investigations of advanced materials.
The new Iliad EELS Spectrometer and Energy Filter with advanced optics and high stability offers unique integration with TEM optics to improve the EELS data collection experience.
To optimize EELS experiments, a broad range of electron energies up to several thousand eV wide must be simultaneously transferred through the microscope and through the spectrometer, from specimen to detector, without introducing chromatic blur or chromatic distortions. To achieve this with other systems, the operator must continuously adjust both microscope and spectrometer settings to maintain the correct experimental conditions. The close integration between microscope electron optics and the spectrometer in the Iliad 300 (S)TEM matches chromatic defocus with the focus of the spectrum, helping to ensure accurate transfer for the entire range of experimental conditions.
Atomically resolved EELS elemental map of LaMnO3/LaFeO3 interface
An electrostatic beam blanker is used in electron microscopy to optimize the electron dose. It selectively blocks or blanks the beam, effectively turning it on and off over the specimen at a high frequency. TEMs typically use magnetic deflectors, which only have a response time in milliseconds and are not as reproducible as electrostatic deflectors. The Nanopulser enables precise temporal control over the electron dose delivered to the sample, giving it a wide range of applications ranging from dose-efficient imaging to time-resolved experiments.
Cutting-edge Thermo Scientific Velox Software for transmission electron microscopy offers comprehensive experimental control. It facilitates access to scanning transmission electron microscope (STEM and TEM) optics and detectors, enhancing reproducibility, yield, and support for quantitative STEM and TEM material analysis.
Velox Software stands out with its integrated ergonomic user interface and ease of use, providing ultimate quality in imaging and compositional mapping. The integrated SmartCam brings efficient setup of experiments. Additionally, it has an interactive detector layout interface for optimal experimental control and documentation on multidetector tools. Velox Software supports high-contrast atomic imaging of light and heavy elements and enables flexible STEM and TEM movie recording for dynamic studies.
Velox Software is equipped with unique packages for electron energy loss spectroscopy and energy-dispersive X-ray spectroscopy on Thermo Scientific EDX detectors. This robust mapping engine integrates multiple techniques optimized for transmission electron microscopy, ensuring the acquisition of best- in-class spectrum images with high yield. The software also provides live feedback during acquisition and fast post-processing of EELS and EDX data.
Overall, Velox Software is a powerful tool that offers excellent control, quality, and versatility in transmission electron microscopy, making it an essential part of the scientific research ecosystem.
For Research Use Only. Not for use in diagnostic procedures.