Iliad Ultra (S)TEM

Iliad Ultra Scanning Transmission Electron Microscope for materials science

The innovative Thermo Scientific Iliad Ultra (S)TEM revolutionizes TEM by enabling acquisition of diﬀerent signals at diﬀerent voltages in a single microscopy session through live HT switching. Traditionally, optimizing imaging for energy-dispersive X-ray spectroscopy and electron energy loss spectroscopy required separate sessions due to the need for diﬀerent voltages.

The fully integrated Iliad Ultra (S)TEM, featuring the cutting-edge Iliad EELS Spectrometer and Energy Filter, dedicated Zebra camera, and Ultra-X Detector, stands out with the highest solid angle. It also features the NanoPulser, an innovative electrostatic beam blanker, and live HT switching that revolutionizes TEM. Seamless data acquisition in Thermo Scientific Velox Software and customized workflows enabled by Thermo Scientific AutoScript Software simplify operation and enable a broad range of applications.

Iliad Ultra (S)TEM advantages

The Iliad Ultra (S)TEM can be operated at diﬀerent voltages between 30 and 300 kV in a single microscopy session. Changing from one accelerating voltage to any other takes about five minutes.
It accommodates an outstanding EDX concept with a 4.45 srad solid angle (or 4.04 srad solid angle with an analytical double tilt holder).
With the new Iliad Ultra (S)TEM, accelerating voltage is an adjustable parameter, just like probe current, and the massive Ultra-X EDX system enables chemical characterization of materials too beam-sensitive for conventional EDX analysis.
The Iliad Ultra (S)TEM’s aberration correction oﬀers an industry-leading level of characterization capabilities for materials science and semiconductor applications at the highest resolution on a wide variety of samples.

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Iliad Ultra (S)TEM features

Live high tension switching on the Iliad Ultra (S)TEM

Live HT switch in the range of operating voltages from 30 kV to 300 kV is crucial for optimizing experimental conditions. It oﬀers ﬂexibility, sample sensitivity control via the targeted experiment setting, resolution optimization, and experimental versatility, helping you achieve the best possible imaging results and explore a variety of scientiﬁc avenues.

Flexibility in voltage selection

TEMs operate using a broad range of energies to characterize every type of material. The ability to switch between a wide range of operating voltages from 30 kV to 300 kV provides the ﬂexibility to select the optimal voltage for your speciﬁc experimental requirements. Diﬀerent samples and imaging techniques may beneﬁt from diﬀerent voltage settings, allowing for enhanced experimental capabilities and versatility.

Sample sensitivity and damage control

Electron microscopy involves exposing samples to high-energy electron beams. The voltage at which the TEM operates directly aﬀects the energy of the electrons and their interaction with the sample. Lower voltages, such as 30 kV, are often used for delicate samples or those that are sensitive to knock-on damage to minimize damage caused by excessive electron energy. On the other hand, higher voltages, such as 300 kV, can provide better penetration through thicker samples, enabling imaging of denser materials or deeper layers.

Resolution and contrast optimization

The choice of operating voltage in a TEM can signiﬁcantly impact the quality of the data obtained. Lower voltages can enhance contrast, particularly for samples suﬀering from knock-on damage, by reducing beam damage and improving image quality. Higher voltages, on the other hand, can improve resolution, allowing for detailed imaging of ﬁne structures and high-resolution analysis.

Experimental versatility

Switching between diﬀerent operating voltages extends the range of experiments and applications that can be carried out using the TEM. You can tailor your experimental conditions to suit speciﬁc sample types, imaging modes, or analytical techniques. This versatility enables a broader range of scientiﬁc investigations, from materials science to nanotechnology.

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Iliad EELS Spectrometer and Energy Filter

The new Iliad EELS Spectrometer and Energy Filter with advanced optics and high stability offers unique integration with TEM optics to improve the EELS data collection experience.

For EELS experiments, a broad range of electron energies up to several thousand eV wide must be simultaneously transferred through the microscope and through the spectrometer, from specimen to detector, without introducing chromatic blur or chromatic distortions. To achieve this with other systems, the operator must continuously adjust both microscope and spectrometer settings to maintain the correct experimental conditions. The close integration between microscope electron optics and the spectrometer in the Iliad Ultra (S)TEM matches chromatic defocus with the focus of the spectrum, helping to ensure accurate transfer for the entire range of experimental conditions.

Atomically resolved EELS elemental map of LaMnO₃/LaFeO₃ interface.

Atomically resolved EELS elemental map of TbScO₃ with Tb shown in green and Sc shown in red.

NanoPulser Electrostatic Beam Blanker

An electrostatic beam blanker is used in electron microscopy to optimize the electron dose. It selectively blocks or blanks the beam, eﬀectively turning it on and oﬀ over the specimen at a high frequency. TEMs typically use magnetic deﬂectors, which only have a response time in milliseconds and are not as reproducible as electrostatic deﬂectors. The Nanopulser enables precise temporal control over the electron dose delivered to the sample, giving it a wide range of applications ranging from dose-eﬃcient imaging to time-resolved experiments.

Electron beam scanning over the specimen with (left) the conventional STEM settings (no blanking) and (right) pulsating beam while beam blanker is on providing 50% blanking of beam during scan and completely blanked ﬂyback signal.

Velox Software

Cutting-edge Thermo Scientiﬁc Velox Software for transmission electron microscopy oﬀers comprehensive experimental control. It facilitates access to scanning transmission electron microscope (STEM and TEM) optics and detectors, enhancing reproducibility, yield, and support for quantitative STEM and TEM material analysis.

Velox Software stands out with its integrated ergonomic user interface and ease of use, providing ultimate quality in imaging and compositional mapping. The integrated SmartCam brings eﬃcient setup of experiments. Additionally, it has an interactive detector layout interface for optimal experimental control and documentation on multidetector tools. Velox Software supports high-contrast atomic imaging of light and heavy elements and enables ﬂexible STEM and TEM movie recording for dynamic studies.

Enhancing EELS and EDX analysis with Velox Software

Velox Software is equipped with unique packages for electron energy loss spectroscopy and energy-dispersive X-ray spectroscopy on Thermo Scientiﬁc EDX detectors. This robust mapping engine integrates multiple techniques optimized for transmission electron microscopy, ensuring the acquisition of best- in-class spectrum images with high yield. The software also provides live feedback during acquisition and fast post-processing of EELS and EDX data.

Overall, Velox Software is a powerful tool that oﬀers excellent control, quality, and versatility in transmission electron microscopy, making it an essential part of the scientiﬁc research ecosystem.