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To support semiconductor manufacturing needs, Thermo Fisher Scientific continues to bring new capabilities to our industry-leading failure analysis, metrology and characterization solutions.
In our Thermo Fisher Scientific PFA Demo Days, we showcased our latest innovations for sample preparation and FinFET logic circuit delayering. The event featured the following live demonstrations:
Register below to view the on-demand recordings.
Jiashi Zhou graduated from University of Manchester with a Master Degree in Materials Science and Engineering.He currently manages the Shanghai nanoport application team at Thermo Fisher Scientific. His team is responsible for SEM, FIB and TEM demonstration for semiconductor industries in APAC.He has worked at chip manufacturing company SMIC as failure analysis engineer for 5 years and joined Thermo Fisher Scientific for 3 years.
Bingxing Wu received the M.S. and Ph.D. degrees in electrical engineering from University of Idaho (UI), Moscow, ID, USA, in 2014 and 2018, respectively. His Ph.D. thesis involved designing multi-pixel CMOS image sensor for traffic monitoring applications.He currently manages the PFA field application team at Thermo Fisher Scientific mainly supporting key/strategy customers in China. His team is responsible for SEM, focused ion beam (FIB) system, Plasma FIB (PFIB), inline large FIB, and TEM products.He has worked at Thermo Fisher Scientific for 3 years.