Additional upgrades for Helios DualBeam (FIB-SEM)

 

Femtosecond laser ablation
  • Unprecedented material removal rates with large-volume collection and investigation of large grain size
  • Ideal solution for traditionally difficult-to-section materials like graphite, carbon, and refectory material
TOF-SIMS Detector
  • Detection and mapping of all elements of the periodic table, including light elements such as hydrogen, lithium, boron, and carbon in difficult samples such as low-carbon steels
  • High-sensitivity elemental analysis capable of detecting concentrations on the parts-per-million (ppm) level
AutoScript: Python Scripting environment
  • Powerful Python scripting (API) for DualBeams, allowing repetitive work to be done faster, more accurately, and with fewer mistakes
Correlative Electron Microscopy Software: MAPS
  • Completely automated solution for generating high-quality, multi-scale image of large overview while preserving the context of observations
  • Correlation of images from different microscopes, including imported images from third-party instruments using the integrated Bio-Formats Library
Auto Slice & View
  • Automated acquisition of high-resolution 3D images and analytical maps such as EBSD (electron backscatter diffraction) or EDS (energy dispersive X-ray spectroscopy)
Avizo Software
  • Advanced image processing, quantification, analysis, and reporting
  • 2D and 3D materials characterization
 

 

Helios PFIB DualBeam (FIB-SEM) upgrades

Key benefits of upgrading Verios G4 to Verios G5

Key benefits of upgrading Helios G4 PFIB to Helios PFIB 5

  • Eliminate slow, tedious, manual processes with SmartAlign Technology, saving  up to 4 hours per week
  • Simplify the image tuning procedure with Flash technology and enhance the user experience
  • Thermo Scientific AutoTEM Software enables high-quality S/TEM sample preparation for users of any experience level in less than one hour
  • Faster performance with new Windows 10 microscope PC
  • DualBeam IT infrastructure suited to latest updates
  • Improved cybersecurity and integration to MS OneDrive
  • Contamination-free TEM specimen preparation with Extended PFIB voltage range to 500 V
 

Additional upgrades for Helios PFIB DualBeam (FIB-SEM)

 

Femtosecond laser ablation
  • Unprecedented material removal rates with large-volume collection and investigation of large grain size
  • Ideal solution for traditionally difficult-to-section materials like graphite, carbon, and refectory material
TOF-SIMS Detector
  • Detection and mapping of all elements of the periodic table, including light elements such as hydrogen, lithium, boron, and carbon in difficult samples such as low-carbon steels
  • High-sensitivity elemental analysis capable of detecting concentrations on the parts-per-million (ppm) level
AutoScript: Python Scripting environment
  • Powerful Python scripting (API) for DualBeams, allowing repetitive work to be done faster, more accurately, and with fewer mistakes
Correlative Electron Microscopy Software: MAPS
  • Completely automated solution for generating high-quality, multi-scale image of large overview while preserving the context of observations
  • Correlation of images from different microscopes, including imported images from third-party instruments using the integrated Bio-Formats Library
Auto Slice & View
  • Automated acquisition of high-resolution 3D images and analytical maps such as EBSD (electron backscatter diffraction) or EDS (energy dispersive X-ray spectroscopy)
Avizo Software
  • Advanced image processing, quantification, analysis, and reporting
  • 2D and 3D materials characterization
 

 

Scios 2 DualBeam (FIB-SEM) upgrades

Key benefits of Quattro software upgrade (Windows 10)

Key benefits of Scios 2 software upgrade (Windows 10)

  • Thermo Scientific AutoTEM Software enables high-quality S/TEM sample preparation for users of any experience level in less than one hour
  • Faster performance with new Windows 10 microscope PC
  • DualBeam IT infrastructure suited to latest updates
  • Improved cybersecurity and integration to MS OneDrive
 

Additional upgrades for Scios DualBeam (FIB-SEM)

 

TOF-SIMS Detector
  • Detection and mapping of all elements of the periodic table, including light elements such as hydrogen, lithium, boron, and carbon in difficult samples such as low-carbon steels
  • High-sensitivity elemental analysis capable of detecting concentrations on the parts-per-million (ppm) level
AutoScript: Python Scripting environment
  • Powerful Python scripting (API) for DualBeams, allowing repetitive work to be done faster, more accurately, and with fewer mistakes
Correlative Electron Microscopy Software: MAPS
  • Completely automated solution for generating high-quality, multi-scale image of large overview while preserving the context of observations
  • Correlation of images from different microscopes, including imported images from third-party instruments using the integrated Bio-Formats Library
Auto Slice & View
  • Automated acquisition of high-resolution 3D images and analytical maps such as EBSD (electron backscatter diffraction) or EDS (energy dispersive X-ray spectroscopy)
Avizo Software
  • Advanced image processing, quantification, analysis, and reporting
  • 2D and 3D materials characterization
 

Accessories

Easylift

Easylift

  • Enables precise, site-specific preparation of ultra-thin TEM lamellae
  • Promotes operator confidence for in situ TEM sample lift-outs—critical for one-of-a-kind samples
  • Pairs with iFAST software for consistent, repeatable preparation and lift-out of ultra-thin TEM samples
  • Allows simple “click and drag” movement due to EasyLift’s full integration with Dualbeam xT UI
  • Supported by the Thermo Fisher Scientific expert applications knowledge in TEM lamella prep solutions

 Download datasheet

µHeater

µHeater

  • Ultra-fast heating solution for in situ high resolution imaging
  • Fully integrated
  • Temperatures up to 1200 °C
CleanConnect Sample Transfer System

CleanConnect Sample Transfer System

  • Sample integrity is preserved by the use of inert gas sample transfer
  • Ergonomic and modular design enables uncomplicated sample handling
  • Seamless, automatic integration to a variety of Thermo Scientific SEM/DualBeams
  • Compact design requiring no changes in system footprint or microscope specifications
  • Compatible with most glove box systems and available with optional direct glove box connectivity

 Download datasheet

QuickLoader

QuickLoader

  • Load lock for fast and easy manual transfer of samples
  • Sample cycle: loading sample, pump down till first image and unloading ≤ 2 minutes
  • Fully interlocked for safe and intuitive operation
  • Compact design requiring no changes in system footprint or microscope specifications
  • Field retrofit possible for most Thermo Scientific SEM/DualBeam microscopes

 Download datasheet

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