Semiconductor Metrology and Process Characterization On-Demand Webinar

Semiconductor metrology and process characterization has a new performance standard

Watch our on-demand webinar, “Automation, precision, and throughput: Introducing the next-generation scanning transmission electron microscope,” which introduces the Metrios 6 (S)TEM and explore its new features.

Register below to view our free on-demand webinar:

  • - Please Select -
  • Afghanistan
  • Albania
  • Algeria
  • Andorra
  • Angola
  • Antarctica
  • Antigua and Barbuda
  • Argentina
  • Armenia
  • Aruba
  • Australia
  • Austria
  • Azerbaijan
  • Bahamas
  • Bahrain
  • Bangladesh
  • Barbados
  • Belarus
  • Belgium
  • Belize
  • Benin
  • Bermuda
  • Bhutan
  • Bolivia
  • Bosnia and Herzegovina
  • Botswana
  • Bouvet Island
  • Brasil
  • Brunei Darussalam
  • Bulgaria
  • Burkina Faso
  • Burundi
  • Cambodia
  • Cameroon
  • Canada
  • Canary Islands
  • Cape Verde
  • Cayman Islands
  • Central African Republic
  • Chad
  • Chile
  • China | 中国
  • Colombia
  • Comoros
  • Congo
  • Congo (Democratic Republic of)
  • Costa Rica
  • Cote Dlvoire (Ivory Coast)
  • Croatia (Hrvatska)
  • Curaçao
  • Cyprus
  • Czech Republic
  • Denmark
  • Djibouti
  • Dominica
  • Dominican Republic
  • Ecuador
  • Egypt
  • El Salvador
  • Eritrea
  • Estonia
  • Ethiopia
  • Faroe Islands
  • Fiji
  • Finland
  • France
  • France Metropolitan
  • French Guyana
  • French Polynesia
  • Gabon
  • Gambia
  • Georgia
  • Germany | Deutschland
  • Ghana
  • Gibraltar
  • Greece
  • Greenland
  • Grenada
  • Guadeloupe
  • Guam
  • Guatemala
  • Guinea
  • Guyana
  • Haiti
  • Honduras
  • Hong Kong
  • Hungary
  • Iceland
  • India
  • Indonesia
  • Iraq
  • Ireland
  • Israel
  • Italy
  • Jamaica
  • Japan | 日本
  • Jordan
  • Kazakhstan
  • Kenya
  • Korea | 대한민국
  • Kuwait
  • Kyrgyzstan
  • Laos
  • Latvia
  • Lebanon
  • Lesotho
  • Liberia
  • Libya
  • Liechtenstein
  • Lithuania
  • Luxembourg
  • Macau
  • Macedonia
  • Madagascar
  • Malawi
  • Malaysia
  • Maldives
  • Mali
  • Malta
  • Martinique
  • Mauritania
  • Mauritius
  • Mayotte
  • Moldova
  • Monaco
  • Mongolia
  • Montenegro
  • Montserrat
  • Morocco
  • Mozambique
  • Myanmar
  • México
  • Namibia
  • Nepal
  • Netherlands
  • New Caledonia
  • New Zealand (Aotearoa)
  • Nicaragua
  • Niger
  • Nigeria
  • Norway
  • Oman
  • Pakistan
  • Palestine
  • Panamá
  • Papua New Guinea
  • Paraguay
  • Perú
  • Philippines
  • Poland
  • Portugal
  • Puerto Rico
  • Qatar
  • Reunion
  • Romania
  • Russia | Россия
  • Rwanda
  • S. Georgia and S. Sandwich Isls.
  • Saint Kitts and Nevis
  • Saint Lucia
  • Saint Vincent and the Grenadines
  • San Marino
  • Sao Tome and Principe
  • Saudi Arabia
  • Senegal
  • Serbia
  • Seychelles
  • Sierra Leone
  • Singapore
  • Slovak Republic
  • Slovenia
  • Somalia
  • South Africa
  • Spain
  • Sri Lanka
  • St. Helena
  • Suriname
  • Svalbard and Jan Mayen Islands
  • Swaziland
  • Sweden
  • Switzerland
  • Syria
  • Taiwan | 台灣
  • Tajikistan
  • Tanzania
  • Thailand
  • Togo
  • Tonga
  • Trinidad and Tobago
  • Tunisia
  • Turkey
  • Turkmenistan
  • Turks and Caicos Islands
  • Uganda
  • Ukraine
  • United Arab Emirates
  • United Kingdom
  • United States
  • United States Minor Outlying Islands
  • Uruguay
  • Uzbekistan
  • Vatican City State (Holy See)
  • Venezuela
  • Vietnam
  • Virgin Islands (British)
  • Virgin Islands (U.S.)
  • Western Sahara
  • Yemen
  • Zambia
  • Zimbabwe
  • - Please Select -
  • - Please Select -
  • Academic
  • Commercial
  • Governmental

I would like to:

Email Permissions

To comply with your preferences, we need to confirm permission to send you communications by email. Personal information provided will be used in accordance with our Privacy Policy.

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Automation, precision, and throughput: Introducing the next-generation scanning transmission electron microscope

New hardware innovations and enhanced automation deliver 20% productivity gain

The new Thermo Scientific Metrios 6 (S)TEM (scanning transmission electron microscope) is a next-generation, fully automated, (S)TEM metrology solution featuring a new stage, EDS detection system, lens, and source technologies. This combination enhances productivity and quickly delivers high-confidence, accurate data to accelerate chip development.

 

Watch our on-demand webinar, “Automation, precision, and throughput: Introducing the next-generation scanning transmission electron microscope,” which introduces the Metrios 6 (S)TEM and explore its new features:

  • Smart Stage—Automatically loads the sample and navigates to the region of interest 
  • Ultra-X EDS detection system—Delivers 2× faster high-efficiency elemental acquisition
  • Constant power lens—Voltage switching in minutes versus hours
  • Smart Automation—Ease of use, scalability and 50× faster model training

Join us to learn about the game-changing Metrios 6 (S)TEM.

About the speaker

Zhenxin Zhong, Sr Manager, Product Marketing, Thermo Fisher Scientific

Dr. Zhenxin Zhong is a Sr. Product Marketing Manager for yield learning TEMs at Thermo Fisher Scientific. Zhenxin is a TEM microscopist with over 10 years of experience in TEM automation. Zhenxin received his PhD in Polymer Science from the University of Akron in the US and holds a Master's in Engineering from Chonbuk National University in Korea and a Bachelor’s in Chemistry from South-Central University for Nationality in China.