Scanning Transmission Electron Microscopy in Semiconductor R&D Webinar

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Demand for high-speed, low-power semiconductor devices is growing. Mobile, cloud services, AI and autonomous vehicles data processing and memory needs push the scaling limits of current technologies. Innovations in materials, architectures and processes are crucial to deliver next generation semiconductor devices.

Advanced semiconductor researchers and developers need atomic scale characterization capabilities to perform fast, repeatable, and damage-free analysis.

Advanced scanning transmission electron microscopes from Thermo Fisher Scientific

The new advanced scanning transmission electron microscope ((S)TEM) provides unparalleled insight, maximizes sample integrity and optimizes productivity.

What will you learn in this webinar

• About the new (S)TEM and its high-performance capabilities.
• How to eliminate beam damage with fast energy dispersive spectroscopy (EDS) and fast high tension (HT) switching capabilities.
• How the Ultra-X EDS detector system delivers fast and easy compositional analysis on advanced materials, light elements and thin specimens.

Who should attend this webinar

Senior technologists and R&D managers at advanced logic and memory manufacturers.

About the Semiconductor SPARK Webinar Series

Save time, save money, and stay on top of semiconductor technology advancement with SPARK, a knowledge community from Thermo Fisher Scientific.

SPARK is a collaborative space where industry thought leaders provide their perspective on tool performance and best practices. SPARK establishes a community for professionals who want to easily access actionable semiconductor and microelectronics insights, and gain visibility to state-of-the-art solutions. This includes the latest updates on Thermo Fisher Scientific’s semiconductor products and workflows.