Wafer DualBeam workflow accelerates time to data versus traditional lab workflows

In this webinar, we discuss the benefits of using a wafer DualBeam instrument to obtain actionable data faster to facilitate fab process improvements.

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We elaborate on the automation and unique capabilities of the Thermo Scientific Helios 5 EXL Wafer DualBeam for cross-section analysis and TEM sample preparation workflows. We also discuss the results of TEM sample preparation supporting advanced node device analysis.

In this webinar, you will learn how:

Using full wafer defect and process monitoring workflows in the fab can provide faster time to data.
Preservation of wafer integrity during analysis enables the tracking of multiple data points from a single wafer.
The unique capabilities of the Helios 5 EXL Wafer DualBeam provide flexible automation and address sample preparation challenges.

About the speaker

Jay Jordan, Sr. Product Marketing Manager, Thermo Fisher Scientific

Jay Jordan is a Sr. Product Marketing Manager for Wafer DualBeam (WDB) products at Thermo Fisher Scientific. Jay has 25 years of experience in electron microscopy, primarily in the semiconductor industry. Prior to joining the product marketing team, he spent 10 years as an application engineer at Thermo Fisher. He received his bachelor’s degrees in mathematics and applied physics from Linfield College.