Pinpointing Power MOSFET Defects: An EFA to PFA Workflow Case Study

Find out how a Thermo Fisher customer improved power MOSFET quality and reliability with a fast and accurate workflow for identifying defects.

Demand for high-performance power MOSFETs is growing as manufacturers of consumer electronics, electric vehicles, and many other devices require improved power management solutions. Higher voltages and frequencies, and integrating new materials into existing processes can bring new product quality and reliability challenges.

To address these challenges, power device vendors need tools that quickly provide fault localization information to improve product quality and reliability.

Introducing an EFA to PFA Workflow for Power MOSFETs

Watch our on-demand webinar to learn how a new electrical failure analysis (EFA) to physical failure analysis (PFA) workflow can help you precisely identify the location of defects and take quick action to minimize yield issues.

You will learn:

  • About an EFA to PFA workflow designed for power MOSFETs fault analysis.
  • How a Thermo Fisher Scientific customer applied this workflow.
  • How localizing faults at the nanoscale can help you increase accuracy and accelerate defect analysis.

Who should attend?

Failure analysis engineers, facilities managers, and fab managers in the semiconductor industry.

About SPARK:

Save time, save money, and stay on top of semiconductor technology advancement at SPARK, a knowledge platform from Thermo Fisher Scientific. 

SPARK is a collaborative space where industry thought leaders provide their perspective on tool performance and best practices. SPARK establishes a community for professionals who want to easily access actionable semiconductor and microelectronics insights, and gain visibility to state-of-the-art solutions. This includes the latest updates on Thermo Fisher Scientific’s semiconductor products and workflows.

Billy Tang, Manager, EFA Sales Division, Thermo Fisher Scientific

About the Speakers:

Billy Tang, Manager, EFA Sales Division, Thermo Fisher Scientific 

Billy Tang is a failure analysis manager with more than 13 years of experience working with semiconductor labs. He has served as senior application specialist for nanoprobing applications in China and as sales development manager in charge of EFA product business development. Billy earned his bachelor’s degree in material and physics at Shanghai University. 

Neel Leslie, Application Engineer Manager, Thermo Fisher Scientific

Neel Leslie, Application Engineer Manager, Thermo Fisher Scientific

Neel Leslie is an application engineer manager who develops and implements new applications and workflows to address systematic yield problems during electrical testing. Neel has been with the company since 2012, starting at FEI as a development engineer. Prior to joining Thermo Fisher Scientific, he worked as a clinical microbiology research intern at the UC Davis Medical Center.

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