Download ebook: SEM and EDS Analysis in Industry

As the complexity of industrial processes increases, so does the need for more rigorous, high-quality analysis to ensure that products meet all standards of quality and reliability. Scanning electron microscopy (SEM) has become a common tool for modern research and development, as well as for failure analysis and troubleshooting, because it provides detailed (nanometer-scale) information about the surface structure of samples. SEM is often used in conjunction with energy dispersive X-ray spectroscopy (EDS), which adds elemental information to the surface imaging data.

Download our ebook, SEM and EDS Analysis in Industry, to learn more about:

How the joint application of SEM and EDS analysis supports in-depth material characterization for industrial applications
How our unique Thermo Scientific ColorSEM Technology integrates these two techniques into a single, fast, easy-to-use package, which is accessible and valuable to novices and experts alike

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