Scanning electron microscope webinar on EDS analysis for materials characterization.

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Do you often struggle with telling sample features apart when looking at greyscale SEM images? Do you find conventional EDS analysis cumbersome and intimidating? The new Thermo Scientific ColorSEM technology offers integrated EDS and always-on color images in a simplified user interface, allowing scientists and engineers to generate more complete information and increase productivity.​

Brandon-Van-Leer

Biography: Brandon van Leer

Product Marketing Engineer SEM / DualBeam, Thermo Fisher Scientific

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 as a Senior Applications Engineer after his tenure at Hewlett Packard as a Materials Engineer in the Imaging and Printing Group. He then led the North American SEM, FIB and Small DualBeam applications team for a number of years. Currently, Brandon is acting as a business development and product marketing engineer for the Materials Science Business Unit. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 15 years of experience with various analytical techniques and for over 9 years has concentrated on applications for SEM and FIB. Brandon’s current research interests are in nanoscale fabrication of 3D structures using FIB technology. Brandon received his BS in Physics (1988) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.

Why should I attend?​

  • See how ColorSEM enables you to see the most complete sample information and detect defects or imperfections you might have missed before.​
  • Learn how always-on, integrated color imaging and elemental analysis helps decrease the time spent developing color images.
  • Discover how ColorSEM technology gives you access to elemental information 2-4 times quicker than conventional techniques. ​

Who should attend?​

  • Engineers interested in using SEM for failure analysis and root cause finding​
  • Scientists and researchers interested in micro-scale imaging and elemental composition​
  • Scientists and researchers using SEM for materials characterization

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