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Materials Science
Secondary Ion Mass Spectrometry
SIMS spectroscopy with focused ion beam milling for light- and trace-element analysis in FIB SEM instruments.
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Analytical characterization of light elements, like lithium, is exceedingly challenging, if not impossible, using common techniques such as energy-dispersive X-ray spectroscopy (EDS). This is also true for high-resolution material analysis of samples with very low elemental concentrations. A SIMS (secondary ion mass spectrometry) detector enables sensitive surface analysis for many industrial and research applications. The technique provides detailed elemental and isotopic information about the sample and is capable of depth profiling analysis.
SEM image of a lithium battery cathode cross-section (left) and corresponding SIMS map showing the lithium distribution (right).
Secondary ion mass spectroscopy (SIMS) is possible on DualBeam (FIB-SEM) tools as ionized particles are generated by the FIB milling process; because these particles come from a very shallow depth it is considered a surface analysis technique. Modern SIMS detectors are compact and well suited for measuring all elements of the periodic table as well as their various isotopes. The key benefits of added SIMS analysis on FIB-SEM instrumentation include:
- Detection and mapping of all elements of the periodic table, including light elements such as hydrogen, lithium, boron, and carbon in difficult samples such as low-carbon steels
- Excellent depth and lateral resolution, which is essential for 3D analytical characterization
- High-sensitivity elemental analysis capable of detecting concentrations on the parts-per-million (ppm) level
- High mass resolution
- Surface composition information
- Separation and analysis of all isotopes and analytical characterization of their spatial distribution
On-demand webinar: Overview and applications of SIMS on DualBeam systems
Watch our recorded webinar to learn about the integration of a ToF-SIMS detector on a DualBeam system and discover its applications for materials science research using Ga+ FIB or multi-ion species Plasma FIB (Xe+, Ar+, O+).
Left: Ion beam image of BAM-L200, a certified reference material, at 30 kV and 1.1 pA. The area marked in red has been scanned with SIMS to collect the aluminum signal. Right: Aluminum TOF-SIMS signal (vertically integrated) showing the W8 (38 nm) and P8–P4 bands, left to right.
Cross-section of a lithium battery cathode with polyvinylidene fluoride (PVDF) binder material. While it is challenging for EDS to map the fluoride distribution it can be efficiently imaged using SIMS mapping (right image).
SIMS enables the simultaneous detection of light and low-concentration elements along with heavy elements.
Documents
On-demand webinar: Overview and applications of SIMS on DualBeam systems
Watch our recorded webinar to learn about the integration of a ToF-SIMS detector on a DualBeam system and discover its applications for materials science research using Ga+ FIB or multi-ion species Plasma FIB (Xe+, Ar+, O+).
Left: Ion beam image of BAM-L200, a certified reference material, at 30 kV and 1.1 pA. The area marked in red has been scanned with SIMS to collect the aluminum signal. Right: Aluminum TOF-SIMS signal (vertically integrated) showing the W8 (38 nm) and P8–P4 bands, left to right.
Cross-section of a lithium battery cathode with polyvinylidene fluoride (PVDF) binder material. While it is challenging for EDS to map the fluoride distribution it can be efficiently imaged using SIMS mapping (right image).
SIMS enables the simultaneous detection of light and low-concentration elements along with heavy elements.
Documents
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Battery Research
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Metals Research
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
Polymers Research
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Geological Research
Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research.
Oil and Gas
As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications.
Nanoparticles
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Catalysis Research
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
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