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Steel microscopy

Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.

Steel inclusion analysis

This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today's efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.


 

Phenom ParticleX Steel Desktop SEM features

Small Footprint

The Phenom ParticleX Steel Desktop SEM needs only standard wall power, allowing it to extend the capabilities of analytical labs without infrastructure changes. The integrated EDS enables users to simply click-and-go to work with elemental mapping and line scan, which shows the quantified element distribution in a line plot.
 

Ease of use

The user interface is based on the proven ease-of-use technology applied in the successful Phenom Desktop SEMs. The interface enables both existing and new customers to quickly become familiar with the system with a minimum of training. The high brightness of the unique CeB6 source aids in capturing high image detail as well as rapid automated analysis of steel inclusions.

Future-proof

While the default classification rules and analysis recipe allow you to quickly get started with steel inclusion analysis, the classification and recipes are fully customizable. This allows you to capture new insights in updated recipes

Steel inclusion analysis software

Building on years of experience in steel inclusion analysis, default classification rules and analysis recipes allow users to quickly capture valuable data.

ChemiSEM Technology

Thermo Scientific ChemiSEM Technology revolutionizes and simplifies EDS analysis by fully integrating SEM and EDS functions into a single, cohesive user interface. Based on live quantification and building on decades of expertise in EDS analysis, the technology provides elemental information quickly and easily, guaranteeing reliable results in less time. ChemiSEM Technology now comes with a powerful new feature: ChemiPhase. ChemiPhase identifies unique phases with a big data approach, finding minor and trace elements while eliminating user bias and reducing possible mistakes.

Learn more


 

Phenom ParticleX Steel Desktop SEM specifications

Electron optical magnification range

  • 160 - 200,000x

Light optical magnification

  • 3–16x

Resolution

  • <10 nm

Image resolution options

  • 960x600, 1920x1200, 3840x2400, 7680x4800 pixels

Acceleration voltages

  • Default: 5 kV, 10 kV and 15 kV
  • Advanced mode: adjustable range between 4.8 kV and 20.5 kV imaging and analysis mode

Vacuum levels

  • Low - medium - high

Detector

  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy (EDS) detector (standard)
  • Secondary electron detector (optional)

Sample size

  • Max. 100x100 mm (up to 36 x 12 mm pin stubs)
  • Max. 40 mm height (optional up to 65 mm)

Sample loading time

  • Light optical <5 s 
  • Electron optical <60 s
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Insights

See how the Phenom ParticleX Steel Desktop SEM performs in the real world with application notes, webinars, and more.

Steel Analysis with the Phenom ParticleX Desktop SEM application note
Read now
Automated SEM analysis of intermetallic particles in aluminum application note
 Read now
Automated Desktop SEM Analysis eBook
Read now
Accelerating Higher-Value Steel Manufacturing blog post
Read now

SEM EDX Analysis of Inclusions in Steel Using ParticleX Desktop SEM webinar

Watch webinar

Resources

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

The Phenom ParticleX Steel Desktop SEM features integrated EDS and software specifically designed for steel manufacturing applications, such as fault and failure analysis, as well as quantitative characterization of inclusions. Register below to watch our recorded webinar and learn more about how the Phenom ParticleX Steel Desktop SEM with EDS enables precise control of the manufacturing process, in turn producing higher quality material.


Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

Phenom ParticleX Steel Desktop SEM inclusion analysis short demonstration.

ParticleX Steel Desktop SEM - Workflow introduction.

Phenom ParticleX Steel analysis of inclusions.

On-demand webinar: New Phenom ParticleX Steel Desktop SEM

The Phenom ParticleX Steel Desktop SEM features integrated EDS and software specifically designed for steel manufacturing applications, such as fault and failure analysis, as well as quantitative characterization of inclusions. Register below to watch our recorded webinar and learn more about how the Phenom ParticleX Steel Desktop SEM with EDS enables precise control of the manufacturing process, in turn producing higher quality material.


Webinar: Scanning electron microscopy: selecting the right technology for your needs

This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:

  • How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
  • How samples are characterized in their natural state without the need for sample preparation.
  • How new advanced automation allows researchers to save time and increase productivity.

Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

Phenom ParticleX Steel Desktop SEM inclusion analysis short demonstration.

ParticleX Steel Desktop SEM - Workflow introduction.

Phenom ParticleX Steel analysis of inclusions.

Applications

Process control using electron microscopy

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.


Techniques

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

3D Materials Characterization

Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.

Learn more ›

EDS Elemental Analysis

Thermo Scientific Phenom Elemental Mapping Software provides fast and reliable information on the distribution of chemical elements within a sample.

Learn more ›

3D EDS Tomography

Modern materials research is increasingly reliant on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with 3D EM and energy dispersive X-ray spectroscopy.

Learn more ›

Atomic-Scale Elemental Mapping with EDS

Atomic-resolution EDS provides unparalleled chemical context for materials analysis by differentiating the elemental identity of individual atoms. When combined with high-resolution TEM, it is possible to observe the precise organization of atoms in a sample.

Learn more ›

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