(S)TEM Techniques on the Iliad (S)TEM Microscope

Perform multiple integrated TEM techniques with the Iliad (S)TEM

With atomistic imaging and spectroscopy capabilities, the Thermo Scientific Iliad (S)TEM provides invaluable insights into the structure and properties of nanoscale materials. 

HRSTEM and HRTEM imaging

Transmission electron microscopy is invaluable for characterizing local structure and defects in various materials. High-resolution STEM and TEM delivers information about the atomic structure of materials. 

Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.

Field visualization with differential phase contrast

Modern electronics research relies on nanoscale analysis of electric and magnetic properties. Differential phase contrast (S)TEM (DPC-STEM) can image the strength and distribution of magnetic fields in a sample and display the magnetic domain structure.

DPC-STEM can provide quantitative information about the field orientation in a magnetic structure. Here, the field orientation for a hexaferrite sample is shown in a color-wheel representation. Sample courtesy of H. Nakajima and S. Mori, Osaka Prefecture University.

Imaging materials in field-free conditions

Lorentz (S)TEM modes enable imaging of magnetic materials while preserving the magnetic structure of the sample. It can be performed either in TEM or STEM mode with extremely high resolution and true field-free conditions across the entire sample. It also enables in-situ magnetization experiments by varying the magnetic field to trigger the magnetic phenomena.

Lorentz ptychograph of FeGe thin film acquired with a residual field of 130 mT, courtesy of Prof. D. Muller, Cornell University. Scale bar equals 50 nm. 

Atomic-scale EDS

Atomic-resolution STEM-EDX provides information about chemical composition on an extremely local scale, helping you correlate structural and chemical information. 

Energy dispersive spectroscopy

Energy dispersive spectroscopy (EDS) provides information on elemental composition at the local scale.

3D EDS tomography

Modern materials research increasingly relies on nanoscale analysis in three dimensions. 3D characterization, including compositional data for full chemical and structural context, is possible with electron tomography coupled with energy dispersive X-ray spectroscopy.

Segmented surface rendering of nanoparticles with elements present: Ag core, Platinum shell (to increase visibility, the Platinum shells have been colored semitransparent).

Electron energy loss spectroscopy

Materials science and semiconductor research benefits from EELS for a wide range of analytical applications. It provides high- throughput, high signal-to-noise-ratio elemental mapping, light element detection, chemical bonding information, as well as probing of oxidation states and surface phonons.

Atomically resolved EELS elemental mapping of LaMnO3/LaFeO3 interface.

In situ experimentation

Direct, real-time observation of microstructural changes with electron microscopy is necessary for understanding the underlying principles of dynamic processes such as recrystallization, grain growth, and phase transformation during heating, cooling, and wetting.

Automated Particle Analysis Workflow

The Thermo Scientific Automated Particle Workflow (APW) is a transmission electron microscopy workflow for nanoparticle analysis, offering large-area, high-resolution imaging and data acquisition at the nanoscale with on-the-fly processing.

For Research Use Only. Not for use in diagnostic procedures.