Webinar

Duration: 59 minutes

Watch this webinar to learn how the latest additions to the Thermo Scientific Helios 5 family of FIB-SEM systems can help you speed up large volume analysis. Now with an integrated femtosecond laser coincident with the scanning electron microscope and focused ion beam, these latest additions to the Helios 5 family allow you to ablate, mill, polish, and SEM image in one chamber without transferring your sample to a second chamber or instrument.

In this webinar you’ll learn how Helios 5 Laser systems deliver:

  • Higher confidence in precisely navigating to the defect for laser ablation and final polishing for accurate and timely data collection for failure analysis
  • Fast material removal using the femtosecond laser—approximately 400 times faster than a PFIB and 15,000 times faster than a Gallium FIB
  • Precise laser cut placement, PFIB milling, and imaging of large cross-sections in minutes without damaging sensitive ROIs/defects from the coincident axis
  • Reduced processing time and sample contamination through the elimination of sample transfers to a separate chamber or instrument
Speaker
Adam Stokes
Adam Stokes, Product Marketing Manager, Thermo Fisher Scientific
Adam is a product marketing manager of plasma focused ion beam (PFIB) and laser products for semiconductor-based applications. Previously, he was an applications scientist specializing in plasma FIB applications for three years. Before joining at Thermo Fisher, Adam worked at the National Renewable Energy Laboratory for six years specializing in electron microscopy and photovoltaics device physics. Adam received his Ph.D. in materials science from the Colorado School of Mines in 2016. His expertise includes plasma source and liquid metal ion source FIB, scanning electron microscopy, and atom probe tomography.
Style Sheet for Komodo Tabs
Style Sheet for Global Design System