FIB SEM | Helios FIB SEM | Webinar | Thermo Fisher Scientific

SPARK Semiconductor On-Demand Webinar

As devices grow increasingly complex, the semiconductor industry is driven to produce higher volumes of quality transmission electron microscopy (TEM) data to support their metrology, characterization and failure analysis needs during device design and fabrication.

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Helios 6 HD FIB SEM webinar overview

Delivering increased productivity compared to other commercially available solutions, the new Thermo Scientific Helios 6 HD FIB-SEM is designed to meet the industry’s need for higher volumes of TEM data.

In this on-demand webinar, you’ll learn how the Helios 6 HD FIB-SEM offers more system availability, more samples per hour, and more high-quality sample output than previous generations.

New features we discuss include:

Digital scanning and patterning engine that allows for simultaneous SEM imaging and milling to deliver improved scan rotation precision and improved cut placement accuracy.
Thermo Scientific AutoTEM 6 Software that offers decreased setup time and many productivity and ease of use improvements.
Thermo Scientific EasyLift NanoManipulator that enables longer intervals between needle changes and a reduction in needle replacement time.

About the speaker

Trevan Landin

Trevan Landin is the Senior Manager Product Marketing for Semiconductor Yield Learning Products at Thermo Fisher Scientific. Trevan has been in the product marketing organization for six years. Before joining the marketing team, Trevan spent ten years in the NanoPort customer demo lab at Thermo Fisher. While in the NanoPort, Trevan worked with customers to determine which Dual Beam or SEM system suited their needs best and then, once installed, helped them achieve their goals with the system they chose.

Before joining Thermo Fisher, Trevan spent 12 years as an FEOL process engineer in the semiconductor industry, focusing on epitaxial depositions on blanket and device wafers. Trevan holds a Bachelor of Science in Chemical Engineering from Washington State University.