Semiconductor Metrology On-Demand Webinar | Thermo Fisher Scientific

Semiconductor metrology and process characterization has a new performance standard

Watch our on-demand webinar, “Automation, precision, and throughput: Introducing the next-generation scanning transmission electron microscope,” which introduces the Metrios 6 (S)TEM and explore its new features.

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Automation, precision, and throughput: Introducing the next-generation scanning transmission electron microscope

New hardware innovations and enhanced automation deliver 20% productivity gain

The new Thermo Scientific Metrios 6 (S)TEM (scanning transmission electron microscope) is a next-generation, fully automated, (S)TEM metrology solution featuring a new stage, EDS detection system, lens, and source technologies. This combination enhances productivity and quickly delivers high-confidence, accurate data to accelerate chip development.

Smart Stage—Automatically loads the sample and navigates to the region of interest
Ultra-X EDS detection system—Delivers 2× faster high-efficiency elemental acquisition
Constant power lens—Voltage switching in minutes versus hours
Smart Automation—Ease of use, scalability and 50× faster model training

Join us to learn about the game-changing Metrios 6 (S)TEM.

About the speaker

Zhenxin Zhong, Sr Manager, Product Marketing, Thermo Fisher Scientific

Dr. Zhenxin Zhong is a Sr. Product Marketing Manager for yield learning TEMs at Thermo Fisher Scientific. Zhenxin is a TEM microscopist with over 10 years of experience in TEM automation. Zhenxin received his PhD in Polymer Science from the University of Akron in the US and holds a Master's in Engineering from Chonbuk National University in Korea and a Bachelor’s in Chemistry from South-Central University for Nationality in China.