Analyzing Silicon Crystallinity | Thermo Fisher Scientific

In this on-demand demonstration, we show how to analyze the crystallinity of silicon through Raman spectroscopy on the Thermo Scientific DXR3 Flex Raman Spectrometer. You can learn why this non-contact, high resolution technique is an ideal tool in the identification, analysis and quantification of crystalline materials.

Who should watch?

Researchers and scientists interested in semiconducting materials
Scientists interested in monitoring varying degrees of crystallinity
Researchers in semiconductor, geology, and graphitic structure industries

About the speaker

Dr. Matt Gabel

Dr. Matt Gabel is a Raman Application Scientist at Thermo Fisher Scientific. He graduated from Washington State University with a Ph.D. in physics, studying the ferroelectric properties of semiconductors. He became deeply involved in vibrational spectroscopy while working as a visiting researcher at Pacific Northwest National Laboratory studying semiconductors with tip-enhanced Raman spectroscopy.

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