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Materials Science
HRTEM and HRSTEM: Atomic Resolution TEM and STEM Imaging
High resolution TEM imaging for the characterization of nanoscale and nanomaterial samples.
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HRTEM
Transmission and scanning transmission electron microscopes (S/TEM) are invaluable tools for the characterization of nanostructures, providing a range of different imaging modes, as well as access to information on elemental composition and electronic structure with high sensitivity. As materials research progressively begins to focus more and more on optimizing material function and behavior at the nanoscale, accurate information at this resolution becomes increasingly essential. High-resolution TEM (HRTEM) and STEM (HRSTEM) deliver the most detailed structural information possible in order to fundamentally characterize samples down to their atomic organization. This is invaluable to nanomaterials research as minor structural inconsistencies and variations can result in substantial changes to the properties of the material. For example, the crystal structure and atomic spacing of the atoms in platinum nanoparticles can have a drastic impact on their catalytic behavior in hydrogen fuel cells.
HRTEM microscopy
Thermo Fisher Scientific offers hardware and software innovations for HRTEM and HRSTEM analysis of a broad range of samples, including beam-sensitive materials. In particular, image quality is often reduced by the influence of drift, vibrations, or other instabilities during acquisition. Drift corrected frame integration (DCFI) is an acquisition method within the Thermo Scientific Velox Software that overcomes this problem, producing images with high contrast and a high signal-to-noise ratio. The addition of Integrated Differential Phase Contrast (iDPC) Software enables the collection of easily interpretable high-resolution images with more reliable, simultaneous imaging of light and heavy elements, even at low-dose conditions.
High-resolution transmission electron microscopes from Thermo Fisher Scientific
The Spectra S/TEM instruments take high-resolution imaging one step further with additional aberration correction via the S-CORR probe aberration corrector, making sub-Angstrom (<0.8 Å) S/TEM imaging regularly attainable. Finally, new Talos and Spectra S/TEM instruments feature the Panther STEM detection system, which includes optimized mechanical alignment and detector geometry for better multi-signal acquisition and mechanical alignment accuracy. It has a higher throughput and easier operation, with linear response of gain/offset and more flexibility in signal processing. Visualize more details with up to 16 segments and a new amplifier design with ultrahigh electron sensitivity for low-dose STEM.
With the combination of high-quality automated S/TEM instrumentation and leading software solutions, HRTEM and HRSTEM imaging are more accessible than ever, giving you the ability to gather unparalleled atomic-resolution information on your most challenging materials.
Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
Battery Research
Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.
Nanoparticles
Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.
Metals Research
Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.
Fibers and Filters
The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features.
Polymers Research
Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.
Catalysis Research
Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.
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