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Microanalysis
A better way to do X-ray microanalysis
Thermo Scientific Pathfinder X-ray microanalysis for SEM/EDS and SEM/WDS avoids the many pitfalls found in traditional elemental-based X-ray microanalysis. Using Spectral Imaging data as its foundation along with an array of processing algorithms that assure the most precise data possible, Pathfinder software goes straight to the classification of the chemical phases in your sample. Useful information arrives in minutes, cleanly and without any analytical bias. Pathfinder software to changes the way you use EDS/EDX and WDS/WDX.
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Featured microanalysis products
Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific Quasor II Electron Backscatter Diffraction. The Quasor II EBSD characterizes crystalline structures which affect physical properties in a wide range of materials like metals, geology samples and semiconductor materials, examined with scanning electron microscopes (SEMs) and X-ray microanalysis.
Improve your spectral imaging for samples like metals, geology and semiconductor materials with the new Thermo Scientific Lumis EBSD System. Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution.
Pathfinder X-ray Microanalysis Software works in concert with your electron microscope for energy-dispersive spectroscopy (EDS) and wavelength-dispersive spectroscopy (WDS). Pathfinder software processes incoming data from the latest X-ray detector technology in novel and efficient ways, dramatically reducing analysis time from hours to minutes.
Achieve unparalleled speed and confidence in your elemental analyses with this spectrometer. Its built-in expert system automatically handles alignment, analysis settings, and data acquisitions to produce a truly integrated EDS/WDS system—making high resolution microanalysis as easy to use as an EDS system.
Develop more accurate interpretations of X-rays faster with this detector, which provides superior resolution at incredibly high collection rates. Used with the Pathfinder X-ray Microanalysis Software, it is ideal for metals and mining, advanced materials and semiconductors.
Learn about WDS Technology
Download the 30-page booklet Wavelength-dispersive (X-ray) Spectroscopy, part of the Wiley Essential Knowledge Briefing series. Learn about this valuable and -- now -- accessible technique complementing SEM/EDS.
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Phenom Desktop Systems give direct access to the high-resolution and high-quality imaging and analysis required in a large variety of applications. The rapid sample loading and the incredibly fast time to image improve the effectiveness of failure analysis, quality insurance processes, or non-destructive testing of materials.
Our innovative microscopy and application expertise helps customers find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world.