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Nanoscale characterization technologies
Thermo Fisher Scientific offers a range of instruments to support your characterization workflow from sample preparation to data analysis. With focused ion beam scanning electron microscopes that quickly and precisely prepare even your most delicate samples, transmission electron microscopes that collect detailed structural and chemical data, and intuitive software that ties them all together, you have a suite of tools that can help you look deeper into the nano-universe.
Sample preparation for nanoscale microscopy and characterization
Sample preparation is one of the most critical tasks in nanoscale materials analysis.
Thermo Scientific Scios and Helios DualBeam Focused Ion Beam Scanning Electron Microscopes automatically prepare a wide range of samples—including air-, moisture-, temperature-, and beam-sensitive materials—in as little as 45 minutes. With high-quality samples free of defects and contamination, you can be sure you will collect accurate, reliable nanoscale data. With over 30 years of experience and more than 2,000 systems installed worldwide, our DualBeams lead the market with innovative features and comprehensive application knowledge.
Explore an optimum solution for your application from our versatile range of DualBeam FIB-SEMs that offer:
- Precise sample modification and high-resolution imaging for comprehensive nanoscale analysis
- Advanced automation capabilities to streamline workflows and enhance productivity
- Versatile applications across academic, government, and industrial environments, catering to a wide range of research and development needs
DualBeam FIB-SEM instrument comparison
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| Instrument | Scios 2 FIB-SEM | Helios 5 FIB-SEM | Helios 5 PFIB-SEM | Helios 5 Hydra PFIB-SEM | Helios 5 Laser PFIB-SEM |
| Milling | Ga+ | Ga+ | Xe+ | Xe+, N+, O+, Ar+ | Xe+, N+, O+, Ar+, Laser |
| Imaging | UHR, LoVac | XHR, HiVac | XHR, HiVac | XHR, HiVac | XHR, HiVac |
| Cross-sectioning and 3D volumes | ≥ 10 µm | ≥ 10 µm | ≥ 100 µm | ≥ 100 µm | ≥ 1 mm |
| TEM sample prep | AutoTEM 5 Basic | AutoTEM 5 Auto | AutoTEM 5, Ga-free | AutoTEM 5, Ga-free | AutoTEM 5, Ga-free |
| Analytical capabilities | EDS, EBSD, SIMS, CL, Raman | ||||
| View product | View product | View product | View product | View product | |
FIB-SEM software
Our cohesive software suites provide user-friendly interfaces and constantly improving automation features, helping you easily increase throughput and generate reliable results.
Transmission electron microscopy in nanoscale characterization
Transmission electron microscopes deliver unparalleled resolution to help you see nanoscale structures and chemical information within your materials.
Thermo Scientific Talos and Spectra TEMs include enhanced electron sources and advanced detectors that deliver accurate, high-quality images along with chemical and structural data that provide unambiguous results. Explore optimum solutions for your application from our unmatched range of transmission electron microscopes.
- Gain detailed insights into material structure and properties at the nanoscale
- Streamline operation, ensure consistent results, and minimize downtime with automated software and workflows
- Start working quickly with simple, intuitive instrument interfaces and navigation
- Perform a wide range of techniques, from analytical research to imaging beam-sensitive materials
TEM instrument comparison
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| Instrument | Talos L120C S/TEM | Talos F200C TEM | Talos F200 i/X TEM |
Spectra 200 S/TEM | Spectra 300 TEM | Spectra Ultra S/TEM |
| Electron gun | Tungsten, LaB6 | S-FEF, X-FEG | S-FEF, X-FEG, X-CFEG | X-CFEG | X-CFEG, X-FEG / Mono, X-FEG / UltiMono | X-CFEG, X-FEG / Mono, X-FEG / UltiMono |
| Cs Correctors | No | No | No | S/TEM | S/TEM, TEM | S/TEM, TEM |
| HR STEM (nm) | 1.0 | 0.2 | 0.16 / 0.14 | 0.06 (ST) / 0.07 XT) | 0.05 (ST) / 0.06 (XT) | 0.05 |
| Pole piece distance (mm) | 11 | 11 | 5.5 | 5.4 (ST) / 6.4 (XT) | 5.4 / 6.4 | 5.4 |
| EDX capabilities (solid angle) | Bruker 30 / 100 (0.18 / 0.8) | Bruker 30 / 100 (0.18 / 0.8) | Super-X / DualX (0.9 / 1.65) | Super-X / DualX (0.7 / 1.76) | Super-X / DualX (0.7 / 1.76) | Ultra X (4.05) |
| EELS capabilities | No | Yes | Yes | Yes | Yes | Yes |
| Cryo capabilities | Cryo box | Cryo box | Cryo holders (XT) | Cryo holders | Cryo box (XT) | Cryo holders |
| Room dimensions (H x L x W) | 2.3 m x 4 m x 3 m | 3.03 m x 4.9 m x 3.9 m | Talos i: 2.8 m x 4 m x 3.6 m Talos X: 3.03 m x 4.9 m x 3.9 m |
3/3.3 m x 6.5 x 6.1 | 3/3.3/3.7 m x 6.5 m x 5.1 m | 3/3.3/3.7 m x 6.5 m x 5.1 m |
| Thermo Scientific Velox Software, oil-free vacuum system, remote control, scripting interface | ||||||
| View product | View product | View product | View product | View product | ||
Transmission electron microscopy software
Our cohesive software suites provide user-friendly interfaces and constantly improving automation features, helping you easily increase throughput and generate reliable results.
DPC (Differential Phase Contrast) of Cobalt film
For Research Use Only. Not for use in diagnostic procedures.