Key learning objectives:

  • How DualBeam FIB-SEM is used to automatically acquire serial sectioning data for 3D characterization
  • Understand the most common sample preparation techniques for FIB-SST in a DualBeam
  • How FIB-SST data is used to generate representative 3D reconstructions for real-world materials

Presenter:

Brandon Van Leer, MS

Brandon Van Leer, MS

Brandon Van Leer joined Thermo Fisher Scientific in late 2004 and has held various positions including Senior Applications Engineer, Applications Manager, and Product Marketing Manager. Currently, he is a Senior Applications & Business Development Manager for DualBeam and SEM instrumentation. Brandon’s professional background has focused largely on materials characterization and development of electronic materials and polymers. He has over 20 years experience in various analytical techniques and over 15+ years exploring SEM and FIB. Brandon’s current research interests are applications development for plasma FIB and multi-ion source plasma FIB. Brandon received his BS in Physics (1998) and his MS in Electrical Engineering (2002) from Oregon State University. He is a member of MSA, MRS and IEEE.
More information

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