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AutoScript TEM Software scripting environment
Thermo Scientific AutoScript TEM Software is a scripting environment combining a TEM-specific Python API with the Python editor. Thermo Scientific software packages for electron/ion microscopy, such as Maps Software and Tomography Software for automation and for mapping, are great for making collection of standard information easy. However, industrial automation and fundamental research often require advanced techniques for imaging and analysis that cannot be covered in the scope of general purpose software. AutoScript TEM Software provides access to the microscope controls in a Python environment to define your application tailored to the question at hand.
Automated electron microscopy workflows
AutoScript TEM Software for TEM is the customization toolkit tor transmission electron microscopes. Built around Python, it provides you the power to automate workflows and associated processing pipelines built to solve specific research questions.
AutoScript TEM Software:
- Provides a direct link between research needs and microscope automation
- Enables improved reproducibility and accuracy
- Focuses time on the microscope for higher throughput
- Empowers new scientific results
Key features
Automated electron microscopy and TEM imaging
Integrated IDE
An integrated development environment (IDE) makes it easy to get up and running with AutoScript TEM Software. Object browsing and syntax tools with auto completion are all included to ensure a rich user experience and rapid, consistent scripting framework.
Python
Harness the power of your microscope using the most popular scientific programming language. AutoScript TEM Software is built on Python 3.5 and includes a number of pre-installed libraries for scientific computing, data analysis, data visualization, image processing, and machine learning.
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AutoScript TEM Software microscope status and controls
- Optics (mode, beam shift, tilt, magnification, rotation)
- Control of Thermo Scientific Selectris Energy Filter
- Stage (movement, position read-out) including piezo stage
- Apertures
- Vacuum (state), column valves controls
- Lorentz mode support
AutoScript TEM Software for image acquisition
- Acquisition (camera and detector control, single image or a sequence, simultaneous acquisition from multiple detectors or segments)
- TEM image acquisition with Thermo Scientific Ceta, Falcon (including counting mode), and SmartCam Cameras
- STEM detectors (insert, retract, gain, offset, individual segments)
- STEM image acquisition with Fischione HAADF, Panther STEM, or Thermo Scientific BF/DF detector
- Acquisition from any segment or combination of segments of Panther STEM
- Post processing of images using integrated Vision Toolkit package
AutoScript TEM Software auto-functions
- TEM autofocus and astigmatism correction
- STEM autofocus including access to OptiSTEM/AutoSTEM (if purchased)
- AutoComa correction
- AI processing available with Scikit-learn
An optional offline mode is available to provide simulation of the microscope. Scripts can be tested offline on user PCs before going to the microscope. Regular updates available with new functionality. For latest information please check: https://www.fei-software-center.com/tem-apps/tem-applications-update-page/
Feature based image segmentation (geological sample).
Compensation of thermal drift during a bulk heating experiment.
Example how to acquire STEM image from12 segments of Panther STEM and HAADF simultaneously
Example of the tile acquisition in TEM. Please also check STEM tiled acquisition script
Example of the tile acquisition in STEM
Example of the work with apertures
Display image metadata
Example of focus series acquisition
Feature based image segmentation (geological sample).
Compensation of thermal drift during a bulk heating experiment.
Example how to acquire STEM image from12 segments of Panther STEM and HAADF simultaneously
Example of the tile acquisition in TEM. Please also check STEM tiled acquisition script
Example of the tile acquisition in STEM
Example of the work with apertures
Display image metadata
Example of focus series acquisition
Process control using electron microscopy
Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.
Quality control and failure analysis
Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.
Fundamental Materials Research
Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.
3D Materials Characterization
Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
3D Materials Characterization
Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample.
Multi-scale analysis
Novel materials must be analyzed at ever higher resolution while retaining the larger context of the sample. Multi-scale analysis allows for the correlation of various imaging tools and modalities such as X-ray microCT, DualBeam, Laser PFIB, SEM and TEM.
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Electron microscopy services for
the materials science
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
Electron microscopy support and resources
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