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The Thermo Scientific Celestron transmission line pulse/very fast transmission line pulse (TLP/VF-TLP) Test System can be configured for both Standard TLP and VF-TLP for testing at the wafer and/or package level. Optional probes can be used to measure signals on pins or pads other than the ones being stressed. The Celestron system software is the most comprehensive in the industry and utilizes graphics to assist in system setup and connection to the device under test (DUT). During test operations, it displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements, and DC I-V curve trace data. The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.
Flexible test capabilities
The Thermo Scientific Celestron TLP/VF-TLP Test System can be configured for Standard TLP and VF-TLP for testing at the wafer level and/or package level. Optional probes can also be used to measure signals on pins or pads other than the ones being stressed.
Unsurpassed test control
The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.
Pulse generator
High current TLP pulse generator.
Probers
Can be interfaced with semiautomatic probers.
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| Standard TLP configuration | Pulse widths from 30 to 500ns | Integrated in the pulser box, the standard TLP Pulse width is 100ns Additional pulse widths can be added externally through a cable change ranging from 30 to 500ns Optional computer controlled pulse width with 3 selectable pulse widths |
| Rise times available | Standard rise time is 200ps Optional rise times from 500ps to 10ns Controlled by optional external rise time filters 2ns and 10ns external rise time filter included Optional computer controlled rise time with 3 selectable rise times Note: 500 MHz or faster oscilloscope is required for TLP measurements 1 GHz or grater scope is recommended for measurements with rise times of less than 1ns | |
| Support of all TLP configurations | Optional changing of configuration for 25 to 500 ohm delivery impedances Support for all configurations described in the ESD Association’s TLP Standard Test Method Both wafer level and package testing at all impedances | |
| Standard TLP / VF-TLP configuration | Integrated system controller | No need for a dedicated computer Windows® operating system |
| Integrated source/meter unit | Curve Tracing to ± 200V Leakage measurements down to 50pA DUT failure detection based on leakage or voltage with forced current or both | |
| Transmission Line Pulse (TLP / VF-TLP) | Designed in compliance with the current ESD Association Standard Test Method Documents (ANSI/ESD STM 5.5.1-2016) | |
| Standard VF-TLP configuration | Pulse widths from 1.2 to 10ns | Selected by cable change at front of system Standard widths are 1.2, 2.5 and 5ns (others optional) |
| Rise times from 200ps to 2ns | Controlled by optional filters Standard rise times are 200 and 300ps 2ns external rise time fi ler included | |
| Maximum pulse current | 15A into a 50 ohm load Approximately 30A into a short circuit | |
| Maximum open circuit voltage | 1500V |
Qualificação de semicondutores ESD
Cada plano de controle de descarga eletrostática (ESD) é necessário para identificar dispositivos sensíveis à ESD. Oferecemos um conjunto completo de sistemas de teste para ajudar com os requisitos de qualificação do seu dispositivo.
Style Sheet for Komodo Tabs
Teste de conformidade ESD
A descarga eletrostática (ESD) pode danificar pequenas características e estruturas em semicondutores e circuitos integrados. Oferecemos um conjunto abrangente de equipamentos de teste que verifica se os dispositivos atendem aos padrões de conformidade de ESD desejados.
Teste de conformidade ESD
A descarga eletrostática (ESD) pode danificar pequenas características e estruturas em semicondutores e circuitos integrados. Oferecemos um conjunto abrangente de equipamentos de teste que verifica se os dispositivos atendem aos padrões de conformidade de ESD desejados.
Style Sheet to change H2 style to p with em-h2-header class
Serviços de microscopia eletrônica para
semicondutores
Para garantir o desempenho ideal do sistema, fornecemos acesso a uma rede de especialistas em serviços de campo, suporte técnico e peças de reposição certificadas.
Suporte e recursos para microscopia eletrônica
Folha de estilo para Rodapé de suporte e serviço
Folha de estilo para Fontes
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