IC designers and QA program managers in manufacturing and test house facilities worldwide have embraced the Thermo Scientific MK.4, a versatile, powerful, and flexible, high yield test system. Easily upgradeable, the MK.4 is fully capable of taking your test operations through ever evolving regulatory and quality standards. The advanced rapid relay-based (modular matrix) hardware of the MK.4 is on average ten times faster than mechanically driven ESD testers. The switching matrix, while providing consistent ESD paths, also allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies. Furthermore, advanced algorithms ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards. A powerful, extraordinarily fast embedded VME controller drives the highest Speed-of-Test execution available. Data transfer between the embedded controller and the testers PC server, is handled through TCP/IP communication protocols, minimizing data transfer time. The testers PC server can be accessed through internal networks, as well as through the Internet, allowing remote access to the system to determine the systems status or to gather result information.

Key Features

Rapid-relay-based operations

Rapid-relay-based operations—up to 2304 channels.

Easy-to-use testing operations

Solid state matrix topology for rapid, easy-to-use testing operations.

Latch-Up stimulus and device biasing

Latch-Up stimulus and device biasing.

Excellent pulse source performance

High voltage power source chassis with patented HV isolation enables excellent pulse source performance.

Advanced device preconditioning

Fully compliant JESD78 latch-up testing allows high voltage/high current stressing to esure a robust design.

Remarkable test and throughput speeds

Massive parallelism drives remarkable test and throughput speeds.

Smaller, faster and smarter devices

Addresses global testing demands for today's modern designs and advanced packaging.


Specifications

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Test devices up to 2304 pins

  • Systems available configured as 1152, 1728 or 2304 pins

Waveform network

  • Two, 12 site HBM (100 pF/1500Ω) and optional MM (200 pF/0Ω) pulse sources address up to 12 devices simultaneously. Patented design ensures waveform compliance for generations to come.

Multiple device selection

  • When multiple devices are present; graphical display indicates the devices selected for test; progress indicator displays the current device under test (DUT), along with test status information 

Dimensions / Weight

  • 60 cm (23.5 in) W x 99 cm (39 in) D x 127 cm (50 in) H; 224 kg (500 lbs) 

Operating temperature

  • +19°C to +22°C (+66°F to +72°F)

Non-operating temperature 

  • 10°C to +60°C (+50°F to +140°F)

Humidity range

  • 30-60% non-condensing

System power requirements

  • 190-230VAC, 3 Phase, 5 wire, WYE configuration, 47-63Hz, 22A
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Resources

Applications

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Qualificação de semicondutores ESD

Cada plano de controle de descarga eletrostática (ESD) é necessário para identificar dispositivos sensíveis à ESD. Oferecemos um conjunto completo de sistemas de teste para ajudar com os requisitos de qualificação do seu dispositivo.


Techniques

Teste de conformidade ESD

A descarga eletrostática (ESD) pode danificar pequenas características e estruturas em semicondutores e circuitos integrados. Oferecemos um conjunto abrangente de equipamentos de teste que verifica se os dispositivos atendem aos padrões de conformidade de ESD desejados.

Saiba mais ›

Teste de conformidade ESD

A descarga eletrostática (ESD) pode danificar pequenas características e estruturas em semicondutores e circuitos integrados. Oferecemos um conjunto abrangente de equipamentos de teste que verifica se os dispositivos atendem aos padrões de conformidade de ESD desejados.

Saiba mais ›

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Serviços de microscopia eletrônica para
semicondutores

Para garantir o desempenho ideal do sistema, fornecemos acesso a uma rede de especialistas em serviços de campo, suporte técnico e peças de reposição certificadas.

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