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In this webinar, Dr. Reuteler of ETH Zürich discuss a wide range of sample preparation applications as well as share some tips and tricks to deal with commonly encountered difficulties and artifacts. Examples using gallium focused ion beam (Ga-FIB), multi ion species plasma FIB, and ultra-short-pulse laser milling are presented.
Dr. Reuteler is a Staff Scientist for the ScopeM platform at ETH Zürich, where he provides training to users on instruments, mainly FIB-SEM and EM sample coating tools but also SEMs and broad ion beam milling instrument. In addtion, he lectures for SEM and FIB block courses, including practical sessions. He also performs service work for user projects and provides first-level technical support and maintenance for two FIB-SEM instruments and two coaters.
ScopeM is the microscopy platform at ETH Zürich (light, electron, and ion microscopy). It is a user facility, i.e., researchers can work autonomously at the instruments, but service work and assistance for data interpretation and analysis are also provided.
Dr. Reuteler has been a Staff Scientist ScopeM since 2012. Before that, he was a software developper at IML /DH lab Uni Basel for one year. In 2012, he recieved his PhD in materials science, Nonmetallic Inorganic Materials group (Professer Gauckler). From 2000 to 2005, he studied Physics at ETH Zürich.
Dr. Min Wu is a trained materials scientist and microscopist who received a doctorate from the University of Oxford in 2015. Since 2016, she has been working for Thermo Fisher Scientific as an application scientist and product specialist for SEM and DualBeam technology with a special interest in plasma FIB.