In this on-demand demonstration session, you can witness the benefits of combining the powers of scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) firsthand. 

You can now easily target the exact point-of-interest when transferring the sample between systems, guaranteeing better data correlation between XPS and SEM tools for more comprehensive surface analysis.

Attend the webinar to learn more about:

  • Transferring the sample to the SEM to get high-resolution imaging of the same positions
  • Analyzing points of interest with XPS to identify and quantify the surface chemistry
  • Combining everything in Maps software to have a complete view of the sample 
Speaker
Robin Simpson, EngD

Robin Simpson, EngD

Robin Simpson is one of the application scientists in the surface analysis team at Thermo Fisher Scientific. In this role Robin is involved in system demonstrations, customer training and the production of marketing content for the surface analysis products. He joined the team in 2017 but had close links to the team for four years prior to that while he was undertaking his engineering doctorate at the University of Surrey. During this time his thesis involved the investigation of the effects of Ar cluster depth profiling on varied material surfaces using the MAGCIS ion source.

Please complete the form below to watch the on-demand webinar