Meridian EX System datasheet
The Thermo Scientific Meridian EX System offers high resolution, non-contact probing capability for the semiconductor failure analysis market. Its unique use of electron beam probing breaks fault localization barriers on advanced logic devices.
Key benefits include:
- Defect localization resolution of <20nm to meet advanced semiconductor roadmap requirements
- Electron beam probing to access defects obscured by backside power distribution networks
- Compatibility with Thermo Scientific analytical workflows
- Timing analysis and at-speed design debug using high-speed electron beam blanking