Download the Application Note: Multi-technique surface analysis of mineral oxides species

Coincident XPS and Raman surface analysis exposes your sample’s properties and opens up exciting new materials characterization opportunities.

The Thermo Scientific™ Nexsa™ XPS System is integrated with a Raman spectrometer to provide a multi-modal analysis platform. The system aligns the XPS analysis position exactly with the Raman analysis position, ensuring that the data is collected from the same position.

Download the application note “Multi-technique surface analysis of mineral oxides species” to learn how:

Surface contamination is removed with argon ion gas clusters;
Ratio of polymorphs in mixed samples can be measured with Raman spectroscopy;
Slight differences are observed with XPS in the valence band spectral shapes acquired from the pure anatase-TiO2 and rutile-TiO2 powders;
Raman shift peak positions improve the ability to differentiate between the anatase and rutile polymorphs;
Both techniques align concurrently to the same position within the vacuum system, ensuring data integrity while saving hours of acquisition time.

*Required field

First Name

Last Name

Company

I would like to:

Speak to a representative

Schedule a demo

Request a quote

Speak to a service representative about our service offerings

Learn more information as a student

Tell us more about your interest timeline:

0–3 months

4–12 months

12+ months

Address 1

Address 2

Business Phone

City

Zip/Postal Code

Comments

To ensure that we are complying with your preferences, we need to confirm permission to send you communications by email.

Email Permission

Please confirm you would like to receive marketing and promotional email messages about Thermo Fisher Scientific products and services.