Iliad (S)TEM Features

EELS optics have the challenge of simultaneously transferring a broad range of electron energies through the microscope and spectrometer, from specimen to detector, without introducing chromatic blur or chromatic distortions. This is a non-trivial task, especially when trying to maintain the transfer across different microscope settings and across different spectrometer settings.

This can only be ensured by closely integrating the optics of the microscope and spectrometer to match the chromatic defocus in the microscope with the focus of the spectrum. Otherwise, the superior performance offered by the tapered prism and ten multipoles could only be fully enjoyed at one or a few specific experimental settings and would be lost when switching to other camera lengths, dispersions, or energy offsets. Our EELS Spectrometer and Energy Filter, combined with advanced optics and high stability, offers unique integration with the TEM optics to improve the EELS data collection experience.

An electrostatic beam blanker is used in electron microscopy to optimize electron dose. It selectively blocks or blanks the beam, effectively turning it on and off over the specimen at a high frequency. TEMs typically use magnetic deflectors, which only have a response time of milliseconds and are not as reproducible as electrostatic deflectors. The Nanopulser — an electrostatic beam blanker — enables precise temporal control over the electron dose delivered to the sample and supports a wide range of applications including, for example, dose-optimized investigations. 

Electron beam scanning over the specimen with (left) the conventional STEM settings (no blanking) and (right) pulsating beam while beam blanker is on providing 50% blanking of beam during scan and completely blanked flyback signal.

Cutting-edge Thermo Scientific Velox Software for transmission electron microscopy offers comprehensive experimental control. It facilitates access to scanning transmission electron microscope (STEM and TEM) optics and detectors, enhancing reproducibility, yield, and support for quantitative STEM and TEM material analysis.

Velox Software stands out with its integrated ergonomic user interface and ease of use, providing high quality in imaging and compositional mapping. The integrated SmartCam brings efficient setup of experiments. Additionally, it has an interactive detector layout interface for optimal experimental control and documentation on multidetector tools. Velox Software supports high-contrast atomic imaging of light and heavy elements and enables flexible STEM and TEM movie recording for dynamic studies.

Velox Software is equipped with unique packages for electron energy loss spectroscopy and energy-dispersive X-ray spectroscopy on Thermo Scientific EDX detectors. This robust mapping engine integrates multiple techniques optimized for transmission electron microscopy, ensuring acquisition of best-in-class spectrum images with high yield. The software also provides live feedback during acquisition and fast post-processing of EELS and EDS data.

Overall, Velox Software is a powerful tool that offers excellent control, quality, and versatility in transmission electron microscopy, making it an essential part of the scientific research ecosystem.