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SEM particle analysis

Thermo Scientific Phenom ParticleX and Perception Desktop SEMs deliver a comprehensive plug-and-play SEM-EDS software solution for particle analysis workflows. Featuring automated characterization, verification, and classification of materials, the instruments support your production with fast, accurate, and reliable data that adheres to industry regulations and standards.

Features include:

  • Fully integrated particle analysis software with SEM-EDS system
  • Certified repeatability and reproducibility
  • Compliance with industry standards in technical cleanliness, steel inclusion analysis, and gunshot residue analysis
  • Automated, unattended long analysis run time
  • Small system footprint with built-in, customizable reporting software
  • Local language support and training
  • Continuous updates based on the latest technology and your feedback

Electron microscopy particle analysis applications

Particle X Technical Cleanliness

Technical cleanliness particle analysis

Perform technical cleanliness at the microscale with the multi-purpose Phenom ParticleX TC Desktop SEM.

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Phenom Particle X Steel

Steel manufacturing particle analysis

Automate steel inclusion analysis and quickly respond to faults and failures with the Phenom ParticleX Steel Desktop SEM.

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Phenom Particle X Additive Manufacturing

Additive manufacturing particle analysis

Analyze samples up to 100 mm x 100 mm and ensure purity at the microscale with the Phenom ParticleX AM Desktop SEM. 

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Phenom Particle X Gunshot Resiude

Gunshot residue particle analysis

Speed up gunshot residue analysis with the automated, long-lasting Phenom Perception GSR Desktop SEM.

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Phenom Particle X Battery

Battery manufacturing materials particle analysis

Effectively trace contaminants in battery materials with the Phenom ParticleX Battery Desktop SEM. 

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Resources

Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series

In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.

  • How to certify your NCM powder quality with SEM+EDS
  • Electron-microscope-grade cleanliness in electronics
  • Speed up your automated gunshot residue analysis
  • Technical cleanliness analysis with an SEM: Why?
  • Understand your steel with automated inclusion analysis
  • One tool for complete AM powder characterization

Applications

Process control using electron microscopy

Process control using electron microscopy

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

Quality control and failure analysis using electron microscopy

Quality control and failure analysis

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

Aluminum mineral grain found with SEM during parts cleanliness testing

Technical Cleanliness

More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle.

Fundamental Materials Research_R&D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 


Samples


Battery Research

Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries.

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Automotive Materials Testing

Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials.

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Metals Research

Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation.

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2D Materials

Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging.

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Polymers Research

Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications.

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Nanoparticles

Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data.

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Catalysis Research

Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties.

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Products

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Phenom XL G2 Desktop SEM

  • For large samples (100x100 mm) and ideal for automation
  • <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage
  • Optional fully integrated EDS and BSE detector

Phenom ParticleX Battery Desktop SEM

  • Versatile solution for high-quality, in-house analysis
  • Automated system and analysis of multiple samples
  • Testing 10x faster

Phenom ParticleX TC Desktop SEM

  • Versatile desktop SEM with automation software for Technical Cleanliness
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Phenom Perception GSR Desktop SEM

  • Dedicated automated GSR desktop SEM
  • Resolution <10 nm; magnification up to 200,000x
  • Longlife CeB6 source

Phenom ParticleX AM Desktop SEM

  • Versatile desktop SEM with automation software for Additive Manufacturing
  • Resolution <10 nm; magnification up to 200,000x
  • Optional SE detector

Nebula Particle Disperser

  • Standard method for uniform dry powder dispersion
  • Avoids particle clusters
  • Used with Phenom Desktop SEM

Phenom ParticleX Steel Desktop SEM

  • SEM and EDS integrated
  • Ease of use
  • Sub-micrometer inclusions
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Electron microscopy services for
the materials science

To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.