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Interviews with experts in materials characterization and analysis
Around the world, electron microscopy and X-ray photoelectron spectroscopy are helping scientists discover and improve the latest materials. We talked to leaders in the materials science community, as well as some of our own scientific experts, about how these tools and the latest instrument innovations help them push the boundaries of science.
Materials science podcasts
Materials scientist interviews
Materials science community insights
“[I am] very impressed with the stability of the Talos. It saves users and students a lot of time.”
Dr. Yufeng Zheng
Assistant Professor, Materials Science and Engineering Program
University of Nevada, Reno
The university was able to run tests that lasted 16 hours+ without an issue, and, in one instance, they ran tests for two and a half days. "The microscope just kept capturing and stitching, and capturing"
Anastas Popratiloff, MD, PhD
Director and Lead Research Scientist
GW Nanofabrication and Imaging Center (GWNIC)
“We are not the type of facility that has the need for an aberration corrected TEM, but we benefit enormously from a state-of-the-art non-corrected FEG (S)TEM with full analytical capabilities, like Talos. We cover a lot of research ground with our instrumentation and characterization capabilities.”
Professor John Balk
Associate Dean for Research and Graduate Studies
University of Kentucky
For Research Use Only. Not for use in diagnostic procedures.