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Scanning electron microscopes (SEM)
Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within many research fields, spanning everything from materials science and life sciences to forensics and industrial manufacturing.
When microscopic information about the surface or near-surface region of a specimen is needed, scanning electron microscopy becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology, and industry.
Scanning electron microscopes for a wide range of samples
Thermo Scientific floor model scanning electron microscopes offer the flexibility and versatility to meet a wide range of academic and industrial needs: support for large and heavy samples, a wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation.
Thermo Fisher Scientific is dedicated to producing analytical scanning electron microscopes that are ideally suited for your specific needs. We offer a range of versatile tools — everything from our easy-to-use desktop instruments such as the Thermo Scientific Phenom Desktop Scanning Electron Microscope to powerhouse instruments capable of unparalleled resolution and contrast like the Thermo Scientific Verios Scanning Electron Microscope.
Comparison of floor model scanning electron microscopes
| Product | Column technology | Stage | Low vacuum | |
|---|---|---|---|---|
| Axia ChemiSEM | SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis | Tetrode-boosted thermionic source | 120x120 mm² 5-axis motorized, eucentric | Optional |
| Prisma E SEM | Environmental SEM suited for a wide range of applications | Tetrode-boosted thermionic source | 110x110 mm2 5-axis motorized, eucentric | Standard |
| Quattro SEM | High resolution environmental SEM for in situ dynamic experiments | Field emission gun (FEG) | 110x110 mm2 5-axis motorized, eucentric | Standard |
| Apreo SEM | Versatile high-performance SEM | In-lens FEG | 110x110 mm2 5-axis motorized, eucentric | Optional |
| Verios SEM | The highest resolution, accuracy, and stability of all Thermo Scientific SEMs | Immersion UC FEG | 150x150 mm2 5-axis eucentric motorized, 2-axis piezo | N/A |
| VolumeScope 2 SEM | 3D SEM for large volume serial block face imaging | In-lens FEG | 110x110 mm2 5 axis motorized, eucentric | Standard |
High-resolution scanning electron microscopes
To maximize resolution and contrast, look no further than our revolutionary Verios and Apreo Scanning Electron Microscopes. These instruments deliver the most detailed information possible, with the excellent contrast and resolution of the Apreo Scanning Electron Microscope only matched by the leading performance of the Verios Scanning Electron Microscope.
Environmental scanning electron microscopes (ESEM)
Environmental scanning electron microscopy (ESEM) is a special technique used to image biological samples in their natural, hydrated state. Unlike traditional scanning electron microscopy, ESEM can examine samples without dehydration. Special environmental chambers maintain a controlled, moist atmosphere. Environmental scanning electron microscopy is valuable for studying dynamic biological processes, such as the behavior of living cells, tissues, or microorganisms, and provides high-resolution images without extensive sample preparation.
The Thermo Scientific Prisma E and Quattro Environmental Scanning Electron Microscopes are capable of remarkable all-around performance under a range of conditions due to the environmental scanning electron microscopy modes, which enable analysis of charging, outgassing, wet, hot, dirty, or otherwise difficult samples. High stability and ease of use (as well as a selection of optional accessories and a highly modular analytical chamber) make these instruments the tools of choice for multi-user labs. Both instruments feature the optional Thermo Scientific ChemiSEM Technology, which colorizes the greyscale image in real time according to elemental composition using combined scanning electron microscopy and energy dispersive X-ray spectroscopy imaging.
Desktop scanning electron microscopes
Thermo Scientific Phenom Desktop Scanning Electron Microscopes redefine speed, ease-of-use and performance thanks to their innovative, user-friendly design and software, which allows even novice users to obtain an image in minutes. The cutting-edge Phenom Pharos Scanning Electron Microscope also features a field emission gun (FEG) source, enabling resolutions below three nanometers.
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Scanning electron microscopes for material science
Discover our wide range of scanning electron microscopes for all your surface characterization needs.
Scanning electron microscopy for life sciences
Learn how Thermo Scientific scanning electron microscopes can reveal the ultrastructure of samples in both 2D and 3D.
Electron microscopy learning center
Electron microscopy resources and reference materials for microscopy novices, experts, and everyone in between. The electron microscopy learning center provides a variety of informational and educational resources on electron microscopy for students, educators, or anyone that simply wants to learn more about this fascinating technology.
Mouse macrophages communicate through bridges known as tunneling nanotubes, active sites involved in the endocytosis of nanoparticles and their transport between cells. This image was taken at a 52° tilt and the nanoparticles were false-colored red. Image courtesy of Dr. Rita Serda, University of New Mexico.
Image of Trypanosoma brucei gambiense parasite (blue) intertwined with red blood cells (red), in a blood capillary (green). Original data collected at a horizontal field width of 45.76 μm. Image courtesy of David Pérez-Morga, Université Libre de Bruxelles.
Artery with red blood cells, captured with environmental scanning electron microscopy.
The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder specimen colorized with ChemiSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Self-catalyzed GaAs microwires imaged on Apreo. Sample courtesy of David Fuster at IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC).
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Mouse macrophages communicate through bridges known as tunneling nanotubes, active sites involved in the endocytosis of nanoparticles and their transport between cells. This image was taken at a 52° tilt and the nanoparticles were false-colored red. Image courtesy of Dr. Rita Serda, University of New Mexico.
Image of Trypanosoma brucei gambiense parasite (blue) intertwined with red blood cells (red), in a blood capillary (green). Original data collected at a horizontal field width of 45.76 μm. Image courtesy of David Pérez-Morga, Université Libre de Bruxelles.
Artery with red blood cells, captured with environmental scanning electron microscopy.
The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia.
SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard.
Corroded solder specimen colorized with ChemiSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm.
The Verios XHR SEM reveals the finest details even on the most beam sensitive samples. This example shows mesoporous SiO₂ imaged at 1 kV.
Self-catalyzed GaAs microwires imaged on Apreo. Sample courtesy of David Fuster at IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC).
Documents
Electron microscopy services
To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts.
Electron microscopy support and resources
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