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Semiconductor Analysis
FIB Circuit Edit
FIB circuit edit and semiconductor prototyping.
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FIB circuit edit and rapid prototyping
Time to market is a critical factor in the success of semiconductor devices. Manufacturing timelines are long and difficult to manage, so it is important that early production runs provide functional devices. Late discovery of design issues limiting device performance at final test can lead to months of delays in product introduction timelines while new mask sets are created, and new devices are manufactured.
Circuit edit systems provide a solution to test and validate design changes, optimize performance, prototype, and scale functional devices for internal and external customer’s development, validation, and qualification. Circuit edit systems utilize high-resolution focused ion beams (FIBs) and advaced chemistries to perform “nano-surgery” on semi-conductor devices, cutting and creating connections within the device to correct design issues and return functioning products. These working devices keep projects on track without the costs and delays of new mask sets.
Circuit edit systems
With the Thermo Scientific Centrios and Centrios HX Circuit Edit Systems, you can manage program costs, avoid schedule delays, and accelerate time-to-market. The Centrios HX System is designed to meet the circuit editing needs of today’s most advanced semiconductor devices. The Centrios System provides circuit edit capability suitable for a wide range of applications where the required circuit edit performance can be delivered with an improved cost of ownership. Both systems are optimized for the modern, competitive technology world.
Introducing the Thermo Scientific Centrios HX Circuit Edit System
Enable working device prototypes and speed up product development cycles with the Centrios HX Circut Edit System.
Circuit edit and semiconductor prototyping workflow
High-resolution focused ion beam milling opens a low-level metal layer with precision and control.
Our instrumentation offers superior contrast with a high signal-to-noise ratio, even at low-kV, revealing active areas of interest while minimizing damage.
The innovative Dual MultiChem Gas Delivery System enables repeatable, precise, and uniform process control.
Planar large-area delayering with unique chemistry performed using the Dual MultiChem Gas Delivery System.
Fundamentals of Circuit Edit eBook
While circuit editing is a well-established technique, it can be especially difficult for those who are new to it. To help you get started, we asked our circuit edit customers what they wish they had known when they started doing FIB circuit edit and collected their feedback, as well as input from our team of experts, in our new eBook: Fundamentals of Circuit Edit. The eBook includes:
- A definition of circuit edit
- An overview of focused ion beams
- Circuit edit tips from experienced practitioners
- Descriptions of key circuit edit tools and solutions
High-resolution focused ion beam milling opens a low-level metal layer with precision and control.
Our instrumentation offers superior contrast with a high signal-to-noise ratio, even at low-kV, revealing active areas of interest while minimizing damage.
The innovative Dual MultiChem Gas Delivery System enables repeatable, precise, and uniform process control.
Planar large-area delayering with unique chemistry performed using the Dual MultiChem Gas Delivery System.
Fundamentals of Circuit Edit eBook
While circuit editing is a well-established technique, it can be especially difficult for those who are new to it. To help you get started, we asked our circuit edit customers what they wish they had known when they started doing FIB circuit edit and collected their feedback, as well as input from our team of experts, in our new eBook: Fundamentals of Circuit Edit. The eBook includes:
- A definition of circuit edit
- An overview of focused ion beams
- Circuit edit tips from experienced practitioners
- Descriptions of key circuit edit tools and solutions
Desenvolvimento e localização de semicondutores
Microscopia eletrônica avançada, feixe de íon focalizado e técnicas analíticas associadas para identificar soluções viáveis e métodos de desenho para a fabricação de dispositivos semicondutores de alto desempenho.
Rampa de escoamento e metrologia
Oferecemos recursos analíticos avançados para análise de defeitos, metrologia e controle de processos projetados para ajudar a aumentar a produtividade e melhorar o rendimento em uma variedade de aplicações e dispositivos semicondutores.
Materiais semicondutores e caracterização de dispositivos
À medida que os dispositivos semicondutores encolhem e se tornam mais complexos, há a necessidade de novos desenhos e estruturas. Os fluxos de trabalho de análise 3D de alta produtividade podem reduzir o tempo de desenvolvimento de dispositivos, maximizar o rendimento e garantir que os dispositivos atendam às necessidades futuras do setor.
Style Sheet for Komodo Tabs
Style Sheet to change H2 style to p with em-h2-header class
Folha de estilo para cartões de instrumentos original
Style Sheet to change H2 style to p with em-h2-header class
Folha de estilo para Rodapé de suporte e serviço
Folha de estilo para Fontes
Folha de estilo para Cartões
Serviços de microscopia eletrônica para
semicondutores
Para garantir o desempenho ideal do sistema, fornecemos acesso a uma rede de especialistas em serviços de campo, suporte técnico e peças de reposição certificadas.
