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Steel microscopy
Metallurgists and researchers in steel manufacturing need scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) data for failure analysis and process improvement. The Thermo Scientific Phenom ParticleX Steel Desktop SEM is a multi-purpose desktop SEM enabling failure analysis and automated characterization of non-metallic inclusions in steel.
Steel inclusion analysis
This versatile solution for high-quality imaging and elemental analysis of steel samples provides the data needed for today's efficient production of high-value steels. Rapid, easy analysis allows you to quickly respond to customer claims of faults, failures, etc., while the automated steel inclusion analysis provides you insight into the steelmaking process.
Small Footprint
The Phenom ParticleX Steel Desktop SEM needs only standard wall power, allowing it to extend the capabilities of analytical labs without infrastructure changes. The integrated EDS enables users to simply click-and-go to work with elemental mapping and line scan, which shows the quantified element distribution in a line plot.
Ease of use
The user interface is based on the proven ease-of-use technology applied in the successful Phenom Desktop SEMs. The interface enables both existing and new customers to quickly become familiar with the system with a minimum of training. The high brightness of the unique CeB6 source aids in capturing high image detail as well as rapid automated analysis of steel inclusions.
Future-proof
While the default classification rules and analysis recipe allow you to quickly get started with steel inclusion analysis, the classification and recipes are fully customizable. This allows you to capture new insights in updated recipes
Steel inclusion analysis software
Building on years of experience in steel inclusion analysis, default classification rules and analysis recipes allow users to quickly capture valuable data.
ChemiSEM Technology
Thermo Scientific ChemiSEM Technology revolutionizes and simplifies EDS analysis by fully integrating SEM and EDS functions into a single, cohesive user interface. Based on live quantification and building on decades of expertise in EDS analysis, the technology provides elemental information quickly and easily, guaranteeing reliable results in less time. ChemiSEM Technology now comes with a powerful new feature: ChemiPhase. ChemiPhase identifies unique phases with a big data approach, finding minor and trace elements while eliminating user bias and reducing possible mistakes.
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Folha de estilo para especificações de tabela de produtos
Blogs SEM Desktop
Deseja conhecer o grande poder da microscopia eletrônica de varredura sem comprometer a usabilidade? Aprimore seu conhecimento sobre a microscopia eletrônica de varredura e descubra como os SEMs Desktop são perfeitamente compatíveis com a pesquisa em nossos blogs Phenom Desktop SEM.
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See how the Phenom ParticleX Steel Desktop SEM performs in the real world with application notes, webinars, and more.
 | SEM EDX Analysis of Inclusions in Steel Using ParticleX Desktop SEM webinarWatch webinar |
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
The Phenom ParticleX Steel Desktop SEM features integrated EDS and software specifically designed for steel manufacturing applications, such as fault and failure analysis, as well as quantitative characterization of inclusions. Register below to watch our recorded webinar and learn more about how the Phenom ParticleX Steel Desktop SEM with EDS enables precise control of the manufacturing process, in turn producing higher quality material.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
BSE image of steel showing complex inclusions and inhomogeneity of precipitation hardened steel
X-ray map showing distribution of O (blue), Al (red), S (yellow), Ti (orange), Mn (green), Fe (gray), Nb (purple)
Ternary diagram showing inclusion size and chemistry
Complex inclusion showing multiple phases
Complex inclusion in steel showing multiple phases
Complex inclusion in steel
Phenom ParticleX Steel Desktop SEM inclusion analysis short demonstration.
ParticleX Steel Desktop SEM - Workflow introduction.
Phenom ParticleX Steel analysis of inclusions.
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
The Phenom ParticleX Steel Desktop SEM features integrated EDS and software specifically designed for steel manufacturing applications, such as fault and failure analysis, as well as quantitative characterization of inclusions. Register below to watch our recorded webinar and learn more about how the Phenom ParticleX Steel Desktop SEM with EDS enables precise control of the manufacturing process, in turn producing higher quality material.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
BSE image of steel showing complex inclusions and inhomogeneity of precipitation hardened steel
X-ray map showing distribution of O (blue), Al (red), S (yellow), Ti (orange), Mn (green), Fe (gray), Nb (purple)
Ternary diagram showing inclusion size and chemistry
Complex inclusion showing multiple phases
Complex inclusion in steel showing multiple phases
Complex inclusion in steel
Phenom ParticleX Steel Desktop SEM inclusion analysis short demonstration.
ParticleX Steel Desktop SEM - Workflow introduction.
Phenom ParticleX Steel analysis of inclusions.
Controle de processo
A indústria moderna exige alta produtividade com qualidade superior, um equilíbrio mantido por meio de um controle de processo robusto. As ferramentas SEM e TEM com software de automação dedicado proporcionam informações rápidas e em várias escalas para monitoramento e aprimoramento de processos.
Controle de qualidade
O controle de qualidade e a garantia de qualidade são essenciais na indústria moderna. Oferecemos uma gama de ferramentas de microscopia eletrônica e espectroscopia para análises multidimensionais e multimodais de defeitos, permitindo que você tome decisões confiáveis e informadas para controle e melhoria de processos.
Caracterização de materiais 3D
O desenvolvimento de materiais muitas vezes requer caracterização 3D em várias escalas. Os instrumentos DualBeam permitem a secção em série de grandes volumes e a subsequente geração de imagens SEM nanométricas, que podem ser processadas em reconstruções 3D de alta qualidade da amostra.
_Technique_800x375_144DPI.jpg)
Análise elementar EDS
A EDS proporciona informações de composição vitais para observações em microscópio eletrônico. Principalmente, nossos exclusivos sistemas detectores Super-X e Dual-X adicionam opções para maior produtividade e/ou sensibilidade, permitindo otimizar a aquisição de dados para atender às prioridades de pesquisa.
_Technique_800x375_144DPI.jpg)
Tomografia EDS 3D
A pesquisa de materiais modernos depende cada vez mais da análise nanométrica em três dimensões. A caracterização 3D, incluindo dados de composição para contexto químico e estrutural completos, é possível com a EM 3D e a espectroscopia de raios X por energia dispersiva.
Mapeamento elementar em escala atômica com EDS
A EDS de resolução atômica fornece um contexto químico sem igual para análise de materiais, diferenciando a identidade elementar de átomos individuais. Quando combinado com a TEM de alta resolução, é possível observar a organização precisa dos átomos em uma amostra.
Caracterização de materiais 3D
O desenvolvimento de materiais muitas vezes requer caracterização 3D em várias escalas. Os instrumentos DualBeam permitem a secção em série de grandes volumes e a subsequente geração de imagens SEM nanométricas, que podem ser processadas em reconstruções 3D de alta qualidade da amostra.
Análise elementar EDS
A EDS proporciona informações de composição vitais para observações em microscópio eletrônico. Principalmente, nossos exclusivos sistemas detectores Super-X e Dual-X adicionam opções para maior produtividade e/ou sensibilidade, permitindo otimizar a aquisição de dados para atender às prioridades de pesquisa.
Tomografia EDS 3D
A pesquisa de materiais modernos depende cada vez mais da análise nanométrica em três dimensões. A caracterização 3D, incluindo dados de composição para contexto químico e estrutural completos, é possível com a EM 3D e a espectroscopia de raios X por energia dispersiva.
Mapeamento elementar em escala atômica com EDS
A EDS de resolução atômica fornece um contexto químico sem igual para análise de materiais, diferenciando a identidade elementar de átomos individuais. Quando combinado com a TEM de alta resolução, é possível observar a organização precisa dos átomos em uma amostra.
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