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Materials Science
HRTEM and HRSTEM: Atomic Resolution TEM and STEM Imaging
High resolution TEM imaging for the characterization of nanoscale and nanomaterial samples.
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HRTEM
Transmission and scanning transmission electron microscopes (S/TEM) are invaluable tools for the characterization of nanostructures, providing a range of different imaging modes, as well as access to information on elemental composition and electronic structure with high sensitivity. As materials research progressively begins to focus more and more on optimizing material function and behavior at the nanoscale, accurate information at this resolution becomes increasingly essential. High-resolution TEM (HRTEM) and STEM (HRSTEM) deliver the most detailed structural information possible in order to fundamentally characterize samples down to their atomic organization. This is invaluable to nanomaterials research as minor structural inconsistencies and variations can result in substantial changes to the properties of the material. For example, the crystal structure and atomic spacing of the atoms in platinum nanoparticles can have a drastic impact on their catalytic behavior in hydrogen fuel cells.
HRTEM microscopy
Thermo Fisher Scientific offers hardware and software innovations for HRTEM and HRSTEM analysis of a broad range of samples, including beam-sensitive materials. In particular, image quality is often reduced by the influence of drift, vibrations, or other instabilities during acquisition. Drift corrected frame integration (DCFI) is an acquisition method within the Thermo Scientific Velox Software that overcomes this problem, producing images with high contrast and a high signal-to-noise ratio. The addition of Integrated Differential Phase Contrast (iDPC) Software enables the collection of easily interpretable high-resolution images with more reliable, simultaneous imaging of light and heavy elements, even at low-dose conditions.
High-resolution transmission electron microscopes from Thermo Fisher Scientific
The Spectra S/TEM instruments take high-resolution imaging one step further with additional aberration correction via the S-CORR probe aberration corrector, making sub-Angstrom (<0.8 Å) S/TEM imaging regularly attainable. Finally, new Talos and Spectra S/TEM instruments feature the Panther STEM detection system, which includes optimized mechanical alignment and detector geometry for better multi-signal acquisition and mechanical alignment accuracy. It has a higher throughput and easier operation, with linear response of gain/offset and more flexibility in signal processing. Visualize more details with up to 16 segments and a new amplifier design with ultrahigh electron sensitivity for low-dose STEM.
With the combination of high-quality automated S/TEM instrumentation and leading software solutions, HRTEM and HRSTEM imaging are more accessible than ever, giving you the ability to gather unparalleled atomic-resolution information on your most challenging materials.
Gallium nitride [212] imaged with HAADF (DCFI) STEM at 300 kV, showing 40.5 pm Ga-Ga dumbbell splitting and 39 pm resolution in the fast Fourier transform on a wide gap (S-TWIN) pole piece.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Extreme-low-dose imaging (166 e-/ Å2) of the metal organic framework (MOF) UiO 66. A probe current of <0.5 pA was used in combination with iDPC and new sensitive STEM detectors to image atomic-level details in this highly dose-sensitive material. Specimen courtesy of Professor Y. Han, King Abdullah University of Science and Technology.
DCFI STEM image of an iron-aluminum alloy nanoparticle (center) with attached aluminum-zirconium precipitates (light grey) on a solid aluminum matrix, acquired on a Talos F200 STEM with Velox Software. Sample courtesy TU Delft, The Netherlands.
DCFI STEM image of individual zirconium atoms on an iron-aluminum alloy, acquired on a Talos F200 STEM with Velox Software. Image width ~14 nm. Sample courtesy TU Delft, The Netherlands.
Potassium tungsten niobate imaged with high-angle annular dark-field (HAADF) imaging high-resolution scanning transmission electron microscopy (HRSTEM) on a Talos F200 STEM. Individual atoms can be clearly seen. Image width ~15 nm.
Platinum/rhodium catalyst nanoparticles imaged on the Talos F200 S/TEM, shown in a large field of view. Digital zoom allows details to be extracted down to the atomic level (inset). The 4k by 4k high-speed Ceta Camera with large field of view enables live digital zooming with high sensitivity and high speed over the entire high-tension range. Sample courtesy of Prof. B. Gorman and Prof. R. Richards, Colorado School of Mines.
High-resolution TEM (HRTEM) image of a BaTiO₃/SrTiO₃ interface acquired on a Talos F200 TEM. Sample courtesy of Prof. Di Wu, Nanjing University.
Pesquisa de materiais fundamentais
Novos materiais são investigados em escalas cada vez menores para o máximo controle de suas propriedades físicas e químicas. A microscopia eletrônica fornece aos pesquisadores percepções importantes sobre uma ampla variedade de características materiais em escala micro a nano.
Pesquisa de baterias
O desenvolvimento de baterias tornou-se possível pela análise em várias escalas com microTC, SEM e TEM, espectroscopia Raman, XPS e visualização e análise 3D digital. Saiba como essa abordagem fornece as informações estruturais e químicas necessárias para construir baterias melhores.
Nanopartículas
Os materiais têm propriedades fundamentalmente diferentes nanometricamente e macrometricamente. Para estudá-las, a instrumentação S/TEM pode ser combinada com a espectroscopia de raios X por energia dispersiva para obter dados de resolução nanométrica ou até mesmo subnanométrica.
Pesquisa de metais
A produção efetiva de metais requer um controle preciso de inclusões e precipitações. Nossas ferramentas automatizadas podem executar uma série de tarefas críticas para a análise de metais, incluindo: contagem de nanopartículas, análise química de EDS e preparação de amostras de TEM.
Fibras e filtros
O diâmetro, a morfologia e a densidade das fibras sintéticas são parâmetros fundamentais que determinam a vida útil e a funcionalidade de um filtro. A microscopia eletrônica de varredura (SEM) é a técnica ideal para investigar essas características de forma rápida e fácil.
Pesquisa de polímeros
A microestrutura de polímero determina as características e o desempenho do material em massa. A microscopia eletrônica permite uma análise abrangente micrométrica da morfologia e da composição do polímero para aplicações de Pesquisa e Desenvolvimento e de controle de qualidade.
Pesquisa geológica
A geociência depende da observação consistente e precisa em várias escalas de recursos em amostras de rochas. A SEM-EDS, combinada com software de automação, permite a análise direta e em larga escala da textura e da composição mineral para a pesquisa da petrologia e da mineralogia.
Pesquisa de catálise
Os catalisadores são essenciais para a maioria dos processos industriais modernos. Sua eficiência depende da composição e da morfologia microscópicas das partículas catalíticas. A EM com EDS é a técnica ideal para estudar essas propriedades.
Folha de estilo para cartões de instrumentos original
Style Sheet for Komodo Tabs
Style Sheet to change H2 style to p with em-h2-header class
Folha de estilo para Rodapé de suporte e serviço
Folha de estilo para Fontes
Folha de estilo para Cartões
Serviços de microscopia eletrônica para
a ciência dos materiais
Para garantir o desempenho ideal do sistema, fornecemos acesso a uma rede de especialistas em serviços de campo, suporte técnico e peças de reposição certificadas.
