伝送ラインパルス検査 | Celestron | Thermo Fisher Scientific

The Thermo Scientific Celestron transmission line pulse/very fast transmission line pulse (TLP/VF-TLP) Test System can be configured for both Standard TLP and VF-TLP for testing at the wafer and/or package level. Optional probes can be used to measure signals on pins or pads other than the ones being stressed. The Celestron system software is the most comprehensive in the industry and utilizes graphics to assist in system setup and connection to the device under test (DUT). During test operations, it displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements, and DC I-V curve trace data. The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.

Key Features

Flexible test capabilities

The Thermo Scientific Celestron TLP/VF-TLP Test System can be configured for Standard TLP and VF-TLP for testing at the wafer level and/or package level. Optional probes can also be used to measure signals on pins or pads other than the ones being stressed.

Unsurpassed test control

The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.

Pulse generator

High current TLP pulse generator.

Probers

Can be interfaced with semiautomatic probers.

Specifications

Style Sheet for Products Table Specifications

Standard TLP configuration	Pulse widths from 30 to 500ns	Integrated in the pulser box, the standard TLP Pulse width is 100ns Additional pulse widths can be added externally through a cable change ranging from 30 to 500ns Optional computer controlled pulse width with 3 selectable pulse widths
	Rise times available	Standard rise time is 200ps Optional rise times from 500ps to 10ns Controlled by optional external rise time filters 2ns and 10ns external rise time filter included Optional computer controlled rise time with 3 selectable rise times Note: 500 MHz or faster oscilloscope is required for TLP measurements 1 GHz or grater scope is recommended for measurements with rise times of less than 1ns
	Support of all TLP configurations	Optional changing of configuration for 25 to 500 ohm delivery impedances Support for all configurations described in the ESD Association’s TLP Standard Test Method Both wafer level and package testing at all impedances
Standard TLP / VF-TLP configuration	Integrated system controller	No need for a dedicated computer Windows® operating system
	Integrated source/meter unit	Curve Tracing to ± 200V Leakage measurements down to 50pA DUT failure detection based on leakage or voltage with forced current or both
	Transmission Line Pulse (TLP / VF-TLP)	Designed in compliance with the current ESD Association Standard Test Method Documents (ANSI/ESD STM 5.5.1-2016)
Standard VF-TLP configuration	Pulse widths from 1.2 to 10ns	Selected by cable change at front of system Standard widths are 1.2, 2.5 and 5ns (others optional)
	Rise times from 200ps to 2ns	Controlled by optional filters Standard rise times are 200 and 300ps 2ns external rise time fi ler included
	Maximum pulse current	15A into a 50 ohm load Approximately 30A into a short circuit
	Maximum open circuit voltage	1500V