K-Alpha X-ray Photoelectron Spectrometer

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The Thermo Scientific K-Alpha X-ray Photoelectron Spectrometer (XPS) System brings a new approach to surface analysis. Focused on delivering high-quality results using a streamlined workflow, the K-Alpha XPS System makes XPS operation simple and intuitive, with no sacrifice in terms of performance or capabilities.

State-of-the-art performance, reduced cost of ownership, increased ease of use, and high sample throughput make the K-Alpha XPS System ideal for a multi-user environment. The K-Alpha XPS System gives more researchers around the world access to surface analysis.

Webinar: Thermo Scientific K-Alpha XPS System

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K-Alpha X-ray Photoelectron Spectrometer features

High-performance X-ray source

The X-ray monochromator allows selection of analysis area from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

Sample viewing

Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.

Insulator analysis

The patented dual-beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.

Depth profiling

Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

Digital Control

Intuitive operation—guided by the Avantage data system—makes the K-Alpha XPS System ideal for both multi-user, shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.

Optional sample holders

Specialist sample holders for angle-resolved XPS, sample bias measurements, or for inert transfer from a glove box are available.

Specifications

재품 표 사항에 대한 스타일시트

Analyzer type	180° double-focusing hemispherical analyzer, 128-channel detector
X-ray source type	Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size	50–400 µm (adjustable in 5 µm steps)
Depth profiling	EX06 ion source
Maximum Sample area	60x60 mm
Maximum sample thickness	20 mm
Vacuum system	Two turbo molecular pumps, with automated titanium sublimation pump and backing pump
Optional accessories	ADXPS sample holder, work function sample holder, glove box

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Style Sheet for Komodo Tabs

2021-MS-XPS-SAS-What is XPS-400x300-144DPI_273553

표면 분석 학습 센터

재질의 표면 또는 층간의 화학 특성은 물질이 어떻게 작용하는지를 결정합니다. 당사의 표면 분석 참고 자료 및 리소스를 사용하면 원하는 속성을 엔지니어링하거나 원하는대로 작동하지 않을 때 재료를 더 잘 이해할 수 있습니다.

XPS 학습 센터

원자 원소의 X선 광전자 분광법입니다

XPS용 Thermo Scientific Avantage Data System의 핵심 기능은 XPS 분석 및 특징 요소와 관련된 광범위한 정보 지식입니다.

원소 표

Resources

Videos

Videos

Samples

배터리 연구

배터리 개발은 microCT, SEM 및 TEM, Raman 분광법, XPS 및 디지털 3D 시각화 및 분석을 통한 멀티 스케일(multi-scale) 분석에 의해 이루어질 수 있습니다. 이 접근 방식이 더 나은 배터리를 만드는 데 필요한 구조 및 화학 정보를 제공하는 방법에 대해 알아보십시오.

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