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Advanced battery materials analysis
Phenom Desktop SEM designed for battery materials analysis
In battery production and research, the quality of materials is becoming critical. Small contaminants in the NCM powder, for example, can have disastrous results in the final product. To trace these contaminants effectively, high-resolution SEM imaging with EDS analysis for chemistry is needed. When fully automated, this combination is a powerful tool for powder quality inspection.
Conductance classifications
Each particle class can be labeled with a conductance of the particles, allowing you to sort on conductance of particles. This allows you to assess the impact of contamination much more accurately since a small organic contamination is not as severe as a metallic conductive contamination.
Ternary diagram
To view overall chemistry of the particle population, a ternary diagram can be generated where all particles are represented. With Ni, Co, and Mn on each axis, the outyears and general trends can be seen instantly.
ChemiSEM Technology
Thermo Scientific ChemiSEM Technology revolutionizes and simplifies EDS analysis by fully integrating SEM and EDS functions into a single, cohesive user interface. Based on live quantification and building on decades of expertise in EDS analysis, the technology provides elemental information quickly and easily, guaranteeing reliable results in less time. ChemiSEM Technology now comes with a powerful new feature: ChemiPhase. ChemiPhase identifies unique phases with a big data approach, finding minor and trace elements while eliminating user bias and reducing possible mistakes.
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Desktop SEM in battery development
See how the Phenom ParticleX Battery Desktop SEM performs in the real world with application notes, webinars, and more.
Improving the Quality of Lithium Batteries Using a Desktop SEM blog post
Lithium Ion Battery Analysis blog post
SEM Particle Analysis for Battery Manufacturing webinar
台式扫描电镜博客
是否想在不影响可用性的前提下释放扫描电子显微术的强大功能？在我们的 Phenom Desktop SEM 博客中，加深您对台式扫描电子显微术的了解，并了解台式 SEM 如何为您的研究提供最佳支持。
Desktop scanning electron microscopes for industrial manufacturing
The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application:
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
Watch our on-demand webinar to learn more about:
- Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
- Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
- Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
- High-quality, in-house SEM quality control
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
Watch our on-demand webinar to learn more about:
- Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
- Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
- Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
- High-quality, in-house SEM quality control
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX
ParticleX Steel Desktop SEM - Workflow introduction
Watch on-demand: Particle Analysis Applications Using Desktop SEM Webinar Series
In each on-demand webinar, our expert will focus on one particular analysis application and how the Phenom ParticleX Desktop SEM overcomes some of the most common challenges. See the abstracts for individual sessions below.
- How to certify your NCM powder quality with SEM+EDS
- Electron-microscope-grade cleanliness in electronics
- Speed up your automated gunshot residue analysis
- Technical cleanliness analysis with an SEM: Why?
- Understand your steel with automated inclusion analysis
- One tool for complete AM powder characterization
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
Watch our on-demand webinar to learn more about:
- Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
- Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
- Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
- High-quality, in-house SEM quality control
On-demand webinar: New Phenom ParticleX Steel Desktop SEM
Watch our on-demand webinar to learn more about:
- Industry-specific software and automation designed specifically for inclusion analysis in metallurgic samples
- Small footprint, which allows it be added to any analytical lab without the need to adjust facility infrastructure
- Easy-to-use interface and sample loading that allow you to begin using the instrument with minimal training
- High-quality, in-house SEM quality control
Watch Phenom ParticleX Desktop SEM: Quality Starts at the Microscale
Watch this on-demand webinar to learn how Phenom ParticleX desktop SEMs are the ideal solution for:
- ISO 16232 and VDA-19 Compliance for Technical Cleanliness.
- ISO 4406 and ISO 4407 for contamination of hydraulic fluids.
- Particle morphology for additive manufacturing feedstocks.
- Workflow examples for particle classifications and reporting.
Webinar: Scanning electron microscopy: selecting the right technology for your needs
This on-demand webinar has been designed to help you decide which SEM best meets your unique needs. We present an overview of Thermo Fisher Scientific SEM technology for multi-user research labs and focus on how these wide-ranging solutions deliver performance, versatility, in situ dynamics and faster time to results. Watch this webinar if you are interested in:
- How the needs for different microanalysis modalities are met (EDX, EBSD, WDS, CL, etc.).
- How samples are characterized in their natural state without the need for sample preparation.
- How new advanced automation allows researchers to save time and increase productivity.
Alexander Bouman on the new Phenom ParticleX
ParticleX Steel Desktop SEM - Workflow introduction
采用电镜进行过程控制
现代工业需求高通量、质量卓越、通过稳健的工艺控制维持平衡。SEM扫描电镜和TEM透射电镜工具结合专用的自动化软件，为过程监控和改进提供了快速、多尺度的信息。
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